Inventor · disambiguated record
Jian-Bin Shiu
Also filed as: SHIU JIAN-BIN
11 granted patents·1 pending application·44 citations·filing 2001–2015
86Inventor score
Top patents by PatentIndex Score
12 records- 0185US9761791B2Conductive pad structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 12, 2017·13 cites·17 claims
- 0279US8092699B2Method for forming phase gratingSHIU JIAN-BIN·Filed 2008·Granted Jan 10, 2012·3 cites·24 claims
- 0366US6524772B1Method of manufacturing phase grating image sensorUNITED MICROELECTRONICS CORP·Filed 2001·Granted Feb 25, 2003·13 cites·20 claims
- 0461US6570145B2Phase grating image sensing device and method of manufactureUNITED MICROELECTRONICS CORP·Filed 2001·Granted May 27, 2003·9 cites·27 claims
- 0560US7943529B2Passivation structure and fabricating method thereofUNITED MICROELECTRONICS CORP·Filed 2008·Granted May 17, 2011·1 cites·20 claims
- 0657US8792171B2Phase grating with three-dimensional configurationSHIU JIAN-BIN·Filed 2011·Granted Jul 29, 2014·0 cites·5 claims
- 0756US9728567B2Semiconductor sensor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Aug 8, 2017·1 cites·16 claims
- 0856US8885253B2Phase grating with three-dimensional configurationUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 11, 2014·0 cites·10 claims
- 0952US8193605B2Bipolar junction transistor integrated with PIP capacitor and method for making the sameSHIU JIAN-BIN·Filed 2009·Granted Jun 5, 2012·4 cites·10 claims
- 1043US9536831B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jan 3, 2017·0 cites·19 claims
- 1136US9070652B2Test structure for semiconductor process and method for monitoring semiconductor processSHIU JIAN-BIN·Filed 2012·Granted Jun 30, 2015·0 cites·17 claims
- 1234US2015076665A1Alignment mark structureUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →