Inventor · disambiguated record
Wern-Yan Koe
Also filed as: KOE WERN-YAN
9 granted patents·140 citations·filing 1999–2021
87Inventor score
Top patents by PatentIndex Score
9 records- 0195US11429481B1Restoring memory data integrityXILINX INC·Filed 2021·Granted Aug 30, 2022·6 cites·20 claims
- 0292US6480980B2Combinational test pattern generation method and apparatusNEC ELECTRONICS INC·Filed 1999·Granted Nov 12, 2002·84 cites·26 claims
- 0380US7742063B2Efficient and high speed 2D data transpose engine for SOC applicationLSI CORP·Filed 2005·Granted Jun 22, 2010·12 cites·16 claims
- 0467US6586969B1Method and system for synchronously initializing digital logic circuitsLSI LOGIC CORP·Filed 2002·Granted Jul 1, 2003·14 cites·20 claims
- 0558US6895488B2DSP memory bank rotationLSI LOGIC CORP·Filed 2002·Granted May 17, 2005·8 cites·20 claims
- 0654US12105658B2Intra-chip and inter-chip data protectionXILINX INC·Filed 2021·Granted Oct 1, 2024·0 cites·20 claims
- 0751US6385748B1Direct access logic testing in integrated circuitsNEC ELECTRONICS INC·Filed 1999·Granted May 7, 2002·16 cites·32 claims
- 0842US7043591B2Cross switch supporting simultaneous data traffic in opposing directionsLSI LOGIC CORP·Filed 2003·Granted May 9, 2006·0 cites·20 claims
- 0936US6782502B2Combinational test pattern generation method and apparatusNEC ELECTRONICS INC·Filed 2002·Granted Aug 24, 2004·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →