Inventor · disambiguated record
Peter Alpern
Also filed as: ALPERN PETER
2 granted patents·35 citations·filing 1990–2001
59Inventor score
Top patents by PatentIndex Score
2 records- 0167US5034611AMethod for non-destructive identification for electronic inhomogeneities in semiconductor layersSIEMENS AG·Filed 1990·Granted Jul 23, 1991·33 cites·7 claims
- 0237US6653732B2Electronic component having a semiconductor chipINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 25, 2003·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →