Inventor · disambiguated record
Jonathan Hugh Batey
Also filed as: BATEY JONATHAN H · BATEY JONATHAN HUGH
7 granted patents·76 citations·filing 1984–2019
82Inventor score
Technology areasH01J
Top patents by PatentIndex Score
7 records- 0183US4535236AApparatus for and method of operating quadrupole mass spectrometers in the total pressure modeVG INSTR GROUP·Filed 1984·Granted Aug 13, 1985·27 cites·17 claims
- 0278US5384461AProcess for the manufacture of a multipolar elongate-electrode lens or mass filterFISONS PLC·Filed 1992·Granted Jan 24, 1995·42 cites·20 claims
- 0375US10541122B2Robust ion sourceMKS INSTR INC·Filed 2017·Granted Jan 21, 2020·2 cites·33 claims
- 0471US8796620B2Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lensSHAW PHILIP NEIL·Filed 2011·Granted Aug 5, 2014·3 cites·18 claims
- 0566US8450681B2Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsetsSHAW PHILIP NEIL·Filed 2011·Granted May 28, 2013·2 cites·14 claims
- 0659US10892153B2Robust ion sourceMKS INSTR INC·Filed 2019·Granted Jan 12, 2021·0 cites·28 claims
- 0737US8796638B2Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lensSHAW PHILIP NEIL·Filed 2011·Granted Aug 5, 2014·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →