Inventor · disambiguated record
Teng-Tsung Huang
Also filed as: HUANG TENG-TSUNG
16 granted patents·15 pending applications·63 citations·filing 2002–2013
90Inventor score
Files withHUANG TENG-TSUNG19HON HAI PREC IND CO LTD5HONGFUJIN PREC IND SHENZHEN3WANG JIA-BIN2CHANG CHANG-SHEN1
Top patents by PatentIndex Score
31 records- 0184US8757450B2Adhesive dispensing assembly and adhesive dispenser using the assemblyHUANG TENG-TSUNG·Filed 2012·Granted Jun 24, 2014·7 cites·7 claims
- 0280US8291774B2Stress test apparatus for hingeHUANG TENG-TSUNG·Filed 2010·Granted Oct 23, 2012·4 cites·20 claims
- 0378US8316720B2Torque testing deviceHUANG TENG-TSUNG·Filed 2010·Granted Nov 27, 2012·6 cites·8 claims
- 0476US8746088B2Cycle life testing machine for pivotable articlesHUANG TENG-TSUNG·Filed 2011·Granted Jun 10, 2014·3 cites·19 claims
- 0576US8534139B2Binding force testing deviceHUANG TENG-TSUNG·Filed 2011·Granted Sep 17, 2013·3 cites·10 claims
- 0674US6766278B2System and method for collecting information and monitoring productionHON HAI PREC IND CO LTD·Filed 2002·Granted Jul 20, 2004·28 cites·13 claims
- 0769US8334668B2Machine motion control systemWANG JIA-BIN·Filed 2010·Granted Dec 18, 2012·3 cites·13 claims
- 0866US8836940B2Test apparatus for liquid crystal displayHUANG TENG-TSUNG·Filed 2011·Granted Sep 16, 2014·1 cites·11 claims
- 0964US8453520B2Hinge durability testing deviceHUANG TENG-TSUNG·Filed 2011·Granted Jun 4, 2013·2 cites·13 claims
- 1062US8490503B2Torque-adjusting machine for hingeHUANG TENG-TSUNG·Filed 2010·Granted Jul 23, 2013·3 cites·18 claims
- 1159US8434376B2Keyboard testing systemHUANG TENG-TSUNG·Filed 2011·Granted May 7, 2013·1 cites·16 claims
- 1255US8537064B2Antenna retaining deviceHUANG TENG-TSUNG·Filed 2011·Granted Sep 17, 2013·1 cites·12 claims
- 1349US7795835B2Step motor driving apparatusHONGFUJIN PREC IND SHENZHEN·Filed 2007·Granted Sep 14, 2010·1 cites·7 claims
- 1448US2006256834A1Method and apparatus for conducting performance test to heat pipeCHANG CHANG-SHEN·Filed 2006·Application pending·0 cites
- 1547US8757005B2Testing moduleHUANG TENG-TSUNG·Filed 2011·Granted Jun 24, 2014·0 cites·10 claims
- 1647US8721398B2Grinding apparatus for removing processing debrisHUANG TENG-TSUNG·Filed 2011·Granted May 13, 2014·0 cites·12 claims
- 1747US2014174348A1Glue coating deviceHON HAI PREC IND CO LTD·Filed 2013·Application pending·0 cites
- 1846US2013126342A1Ionization device and evaporation deposition device using the ionization deviceHUANG TENG-TSUNG·Filed 2012·Application pending·0 cites
- 1946US2013168242A1Magnetic core for cylindrical magnetron sputtering targetHUANG TENG-TSUNG·Filed 2012·Application pending·0 cites
- 2046US2013133570A1Vacuum deposition deviceHUANG TENG-TSUNG·Filed 2012·Application pending·0 cites
- 2145US2014174347A1Mounting assembly for adhesive dispenser and adhesive dispenser using sameHON HAI PREC IND CO LTD·Filed 2013·Application pending·0 cites
- 2244US2013337164A1Adhesive dispenser and adhesive nozzle regulating methodHON HAI PREC IND CO LTD·Filed 2013·Application pending·0 cites
- 2341US2013213113A1Impact testing deviceHONGFUJIN PREC IND SHENZHEN·Filed 2012·Application pending·0 cites
- 2441US2012241094A1Spot gluing deviceHUANG TENG-TSUNG·Filed 2011·Application pending·0 cites
- 2541US2014002635A1External surface measuring apparatus and operation meathod using sameHONGFUJIN PREC IND SHENZHEN·Filed 2012·Application pending·0 cites
- 2640US2013045664A1Sandblasting apparatusHON HAI PREC IND CO LTD·Filed 2012·Application pending·0 cites
- 2739US2012210807A1Testing moduleHUANG TENG-TSUNG·Filed 2011·Application pending·0 cites
- 2839US2013056352A1Medium frequency magnetron sputtering deviceCHANG HSIN-PEI·Filed 2012·Application pending·0 cites
- 2937US2013264199A1Cylindrical magnetron sputtering target assemblyHUANG TENG-TSUNG·Filed 2012·Application pending·0 cites
- 3037US2012212236A1Testing device for computer connectorHUANG TENG-TSUNG·Filed 2011·Application pending·0 cites
- 3136US8415912B2Machine motion control systemWANG JIA-BIN·Filed 2010·Granted Apr 9, 2013·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →