Inventor · disambiguated record
Takeshi Ogashiwa
Also filed as: OGASHIWA TAKESHI
7 granted patents·1 pending application·33 citations·filing 2005–2015
81Inventor score
Technology areasH01J
Top patents by PatentIndex Score
8 records- 0186US9040911B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted May 26, 2015·8 cites·8 claims
- 0285US7550724B2Electron beam device and its control methodHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 23, 2009·9 cites·8 claims
- 0382US8026491B2Charged particle beam apparatus and method for charged particle beam adjustmentHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 27, 2011·9 cites·5 claims
- 0468US8124940B2Charged particle beam apparatusSHIGETO KUNJI·Filed 2009·Granted Feb 28, 2012·3 cites·5 claims
- 0564US8455823B2Charged particle beam deviceICHIMURA TAKASHI·Filed 2009·Granted Jun 4, 2013·2 cites·18 claims
- 0663US8853647B2Electron microscopeOGASHIWA TAKESHI·Filed 2012·Granted Oct 7, 2014·2 cites·14 claims
- 0741US10453648B2Charged particle bean device and information-processing deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 22, 2019·0 cites·15 claims
- 0839US2006219907A1Charged particle beam apparatus, method of displaying sample image, and method of measuring image shift sensitivityOGASHIWA TAKESHI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →