Inventor · disambiguated record
Masakatsu Suda
Also filed as: SUDA MASAKATSU
44 granted patents·4 pending applications·547 citations·filing 1996–2022
98Inventor score
Top patents by PatentIndex Score
48 records- 0197US6208161B1Differential signal transmission circuitADVANTEST CORP·Filed 1998·Granted Mar 27, 2001·262 cites·11 claims
- 0288US7830191B2Vernier delay circuitADVANTEST CORP·Filed 2009·Granted Nov 9, 2010·16 cites·7 claims
- 0387US7398169B2Measuring apparatus, measuring method, testing apparatus, testing method, and electronics deviceADVANTEST CORP·Filed 2006·Granted Jul 8, 2008·15 cites·26 claims
- 0482US7071746B2Variable delay circuitADVANTEST CORP·Filed 2004·Granted Jul 4, 2006·22 cites·6 claims
- 0578US7492198B2Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuitADVANTEST CORP·Filed 2002·Granted Feb 17, 2009·20 cites·14 claims
- 0677US7944263B2Timing generator and semiconductor test apparatusADVANTEST CORP·Filed 2006·Granted May 17, 2011·8 cites·7 claims
- 0777US7511547B2Delay circuit, and testing apparatusADVANTEST CORP·Filed 2006·Granted Mar 31, 2009·10 cites·27 claims
- 0876US7382117B2Delay circuit and test apparatus using delay element and bufferADVANTEST CORP·Filed 2005·Granted Jun 3, 2008·9 cites·9 claims
- 0975US6842061B2Timing generating apparatus and test apparatusADVANTEST CORP·Filed 2004·Granted Jan 11, 2005·17 cites·14 claims
- 1074US6717479B2Delay circuit and ring oscillatorADVANTEST CORP·Filed 2001·Granted Apr 6, 2004·16 cites·17 claims
- 1173US7908110B2Test device, test method and computer readable mediaADVANTEST CORP·Filed 2008·Granted Mar 15, 2011·4 cites·15 claims
- 1273US5969555APulse width forming circuitADVANTEST CORP·Filed 1998·Granted Oct 19, 1999·26 cites·17 claims
- 1371US7535273B2Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuitADVANTEST CORP·Filed 2007·Granted May 19, 2009·6 cites·11 claims
- 1470US7782075B2Electronic device, load fluctuation compensation circuit, power supply, and test apparatusADVANTEST CORP·Filed 2008·Granted Aug 24, 2010·6 cites·11 claims
- 1568US8375340B2Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording mediumADVANTEST CORP·Filed 2010·Granted Feb 12, 2013·2 cites·16 claims
- 1668US7034723B2Timing comparator, data sampling apparatus, and testing apparatusADVANTEST CORP·Filed 2004·Granted Apr 25, 2006·16 cites·10 claims
- 1767US7940072B2Timing generator and semiconductor test apparatusADVANTEST CORP·Filed 2006·Granted May 10, 2011·5 cites·7 claims
- 1867US7558692B2Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatusADVANTEST CORP·Filed 2005·Granted Jul 7, 2009·5 cites·6 claims
- 1966US7714600B2Load fluctuation correction circuit, electronic device, testing device, and timing generating circuitADVANTEST CORP·Filed 2006·Granted May 11, 2010·6 cites·15 claims
- 2066US7696771B2Test apparatus and test methodADVANTEST CORP·Filed 2008·Granted Apr 13, 2010·4 cites·22 claims
- 2165US12055570B2Measurement apparatus, measurement method and computer readable mediumADVANTEST CORP·Filed 2022·Granted Aug 6, 2024·0 cites·15 claims
- 2260US7665004B2Timing generator and semiconductor testing apparatusADVANTEST CORP·Filed 2005·Granted Feb 16, 2010·3 cites·9 claims
- 2360US7460969B2Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor deviceADVANTEST CORP·Filed 2006·Granted Dec 2, 2008·3 cites·12 claims
- 2459US9871788B2Authentication terminalADVANTEST CORP·Filed 2015·Granted Jan 16, 2018·1 cites·9 claims
- 2557US8555098B2Semiconductor circuit with load balance circuitFUJIBE TASUKU·Filed 2008·Granted Oct 8, 2013·4 cites·21 claims
- 2656US6987410B2Clock recovery circuit and communication deviceADVANTEST CORP·Filed 2004·Granted Jan 17, 2006·9 cites·9 claims
- 2755US8058891B2Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration methodHASUMI TAKUYA·Filed 2006·Granted Nov 15, 2011·4 cites·7 claims
- 2854US7800390B2Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction methodADVANTEST CORP·Filed 2009·Granted Sep 21, 2010·2 cites·21 claims
- 2954US6530053B1Semiconductor deviceADVANTEST CORP·Filed 2000·Granted Mar 4, 2003·6 cites·32 claims
- 3052US5710744ATiming generator for IC testersADVANTEST CORP·Filed 1996·Granted Jan 20, 1998·17 cites·7 claims
- 3149US7574316B2Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor deviceADVANTEST CORP·Filed 2008·Granted Aug 11, 2009·1 cites·12 claims
- 3249US7142031B2Delay device, semiconductor testing device, semiconductor device, and oscilloscopeADVANTEST CORP·Filed 2004·Granted Nov 28, 2006·3 cites·25 claims
- 3349US6008686APower consumption control circuit for CMOS circuitADVANTEST CORP·Filed 1998·Granted Dec 28, 1999·10 cites·6 claims
- 3447US8198926B2Loop type clock adjustment circuit and test deviceFUJITA KAZUHIRO·Filed 2009·Granted Jun 12, 2012·1 cites·20 claims
- 3546US8330471B2Signal generation and detection apparatus and testerSUDA MASAKATSU·Filed 2008·Granted Dec 11, 2012·1 cites·8 claims
- 3642US8451034B2Clock hand-off circuitFUJIBE TASUKU·Filed 2008·Granted May 28, 2013·0 cites·14 claims
- 3741US7979218B2Test apparatus, test method and computer readable mediumADVANTEST CORP·Filed 2008·Granted Jul 12, 2011·0 cites·11 claims
- 3841US6769082B1Delay device, semiconductor testing device, semiconductor device, and oscilloscopeADVANTEST CORP·Filed 1999·Granted Jul 27, 2004·7 cites·6 claims
- 3941US2006170472A1Variable delay circuitADVANTEST CORP·Filed 2006·Application pending·0 cites
- 4040US7960996B2Variable delay circuit, timing generator and semiconductor testing apparatusADVANTEST CORP·Filed 2007·Granted Jun 14, 2011·0 cites·5 claims
- 4139US7863990B2Oscillation circuit, test apparatus and electronic deviceADVANTEST CORP·Filed 2008·Granted Jan 4, 2011·0 cites·8 claims
- 4239US2008258714A1Delay circuit and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 4338US7755407B2Variable delay circuit, testing apparatus, and electronic deviceADVANTEST CORP·Filed 2008·Granted Jul 13, 2010·0 cites·10 claims
- 4436US7987062B2Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing methodADVANTEST CORP·Filed 2007·Granted Jul 26, 2011·0 cites·13 claims
- 4536US2011231128A1Test apparatus, measurement apparatus, and electronic deviceADVANTEST CORP·Filed 2011·Application pending·0 cites
- 4633US9871789B2Authentication system, authentication method and service providing systemADVANTEST CORP·Filed 2015·Granted Jan 16, 2018·0 cites·13 claims
- 4733US8441296B2Timing generator and test apparatusSUDA MASAKATSU·Filed 2011·Granted May 14, 2013·0 cites·13 claims
- 4831US2009184741A1Delay lock loop circuit, phase lock loop circuit, timing generator, semiconductor tester and semiconductor integrated circuitSUDA MASAKATSU·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →