Assignee
SUDA MASAKATSU
JP·2 granted patents·1 pending application·1 citations·filing 2005–2011
Top patents by PatentIndex Score
3 records- 0146US8330471B2Signal generation and detection apparatus and testerSUDA MASAKATSU·Filed 2008·Granted Dec 11, 2012·1 cites·8 claims
- 0233US8441296B2Timing generator and test apparatusSUDA MASAKATSU·Filed 2011·Granted May 14, 2013·0 cites·13 claims
- 0331US2009184741A1Delay lock loop circuit, phase lock loop circuit, timing generator, semiconductor tester and semiconductor integrated circuitSUDA MASAKATSU·Filed 2005·Application pending·0 cites
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