Inventor · disambiguated record
Chin-Pen Yeh
Also filed as: YEH CHIN-PEN
10 granted patents·2 pending applications·16 citations·filing 2003–2013
83Inventor score
Top patents by PatentIndex Score
12 records- 0176US8017486B2Method of fabricating low on-resistance lateral double-diffused MOS deviceMACRONIX INT CO LTD·Filed 2007·Granted Sep 13, 2011·6 cites·8 claims
- 0267US7829408B2Laterally double-diffused metal oxide semiconductor transistor and method for fabricating the sameMACRONIX INT CO LTD·Filed 2009·Granted Nov 9, 2010·3 cites·8 claims
- 0366US7868370B2Single gate nonvolatile memory cell with transistor and capacitorMACRONIX INT CO LTD·Filed 2008·Granted Jan 11, 2011·3 cites·21 claims
- 0462US7525153B2Laterally double-diffused metal oxide semiconductor transistor and method for fabricating the sameMACRONIX INT CO LTD·Filed 2006·Granted Apr 28, 2009·2 cites·7 claims
- 0560US8525243B2Single gate semiconductor deviceLIN CHENG-CHI·Filed 2011·Granted Sep 3, 2013·1 cites·20 claims
- 0658US7999296B2Single gate nonvolatile memory cell with transistor and capacitorMACRONIX INT CO LTD·Filed 2008·Granted Aug 16, 2011·1 cites·22 claims
- 0749US8981451B2Semiconductor memory devicesMACRONIX INT CO LTD·Filed 2013·Granted Mar 17, 2015·0 cites·8 claims
- 0845US8362558B2Low on-resistance lateral double-diffused MOS deviceMACRONIX INT CO LTD·Filed 2011·Granted Jan 29, 2013·0 cites·8 claims
- 0943US8487360B2Semiconductor memory devices with high gate coupling ratio and methods of manufacturing the sameLIN CHENG-CHI·Filed 2010·Granted Jul 16, 2013·0 cites·14 claims
- 1036US8319315B2Bipolar junction transistor devicesLIN CHENG-CHI·Filed 2010·Granted Nov 27, 2012·0 cites·17 claims
- 1133US2005062162A1Pad structure of semiconductor device for reducing or inhibiting wire bonding cracksFiled 2003·Application pending·0 cites
- 1230US2012292740A1High voltage resistance semiconductor device and method of manufacturing a high voltage resistance semiconductor deviceLIN CHEN-YUAN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →