Inventor · disambiguated record

Marc Jay Weiss

Also filed as: WEISS MARC JAY

2 granted patents·59 citations·filing 1995–1995

65Inventor score

Technology areasH10P

Files withIBM1 SIEMENS AG1

Top patents by PatentIndex Score

2 records

0166US6258497B1Precise endpoint detection for etching processesIBM·Filed 1995·Granted Jul 10, 2001·38 cites·14 claims
0251US5670018AIsotropic silicon etch process that is highly selective to tungstenSIEMENS AG·Filed 1995·Granted Sep 23, 1997·21 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →