Inventor · disambiguated record
Makoto Hatakenaka
Also filed as: HATAKENAKA MAKOTO
29 granted patents·3 pending applications·488 citations·filing 1994–2021
97Inventor score
Files withMITSUBISHI ELECTRIC CORP14IIX INC6RENESAS TECH CORP5MITSUBISHI ELEC SYS LSI DESIGN3MISUBISHI DENKI KABUSHIKI KAIS1
Top patents by PatentIndex Score
32 records- 0191US6310815B1Multi-bank semiconductor memory device suitable for integration with logicMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 30, 2001·98 cites·23 claims
- 0278US5910181ASemiconductor integrated circuit device comprising synchronous DRAM core and logic circuit integrated into a single chip and method of testing the synchronous DRAM coreMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 8, 1999·40 cites·9 claims
- 0377US5949268AVariable delay circuit for varying delay time and pulse widthMISUBISHI DENKI KABUSHIKI KAIS·Filed 1997·Granted Sep 7, 1999·34 cites·17 claims
- 0476US6512707B2Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 28, 2003·20 cites·9 claims
- 0575US5930194ASemiconductor memory device capable of block writing in large bus widthMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 27, 1999·37 cites·12 claims
- 0672US7237175B2Memory circuitRENESAS TECH CORP·Filed 2002·Granted Jun 26, 2007·18 cites·3 claims
- 0772US6163493ASemiconductor integrated circuit device with large internal bus width, including memory and logic circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 19, 2000·32 cites·15 claims
- 0871US7716410B2Information device including main processing circuit, interface circuit, and microcomputerRENESAS TECH CORP·Filed 2006·Granted May 11, 2010·3 cites·7 claims
- 0963US6756803B2Semiconductor device downsizing its built-in driverMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 29, 2004·11 cites·10 claims
- 1063US5539344APhase-locked circuit and interated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jul 23, 1996·39 cites·18 claims
- 1161US5973953ASemiconductor memory device having improved bit line structureMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Oct 26, 1999·24 cites·10 claims
- 1260US6724237B2Semiconductor integrated circuit for multi-chip package with means to optimize internal drive capacityRENESAS TECH CORP·Filed 2002·Granted Apr 20, 2004·9 cites·12 claims
- 1360US5459419ASynchronizing pulse generating circuitMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Oct 17, 1995·19 cites·16 claims
- 1458US5534805ASynchronized clock generating apparatusMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 9, 1996·39 cites·14 claims
- 1555USRE39579ESemiconductor integrated circuit device comprising RAM with command decode system and logic circuit integrated into a single chip and testing method of the RAM with command decode systemRENESAS TECH CORP·Filed 2001·Granted Apr 17, 2007·4 cites·16 claims
- 1654US5487097APeriod measuring deviceMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jan 23, 1996·16 cites·22 claims
- 1749US6715117B2Method of testing a semiconductor memory deviceRENESAS TECH CORP·Filed 2001·Granted Mar 30, 2004·6 cites·12 claims
- 1847US12148402B2Panel drive circuitIIX INC·Filed 2021·Granted Nov 19, 2024·0 cites·4 claims
- 1947US7984223B2Information device including main processing circuit, interface circuit, and microcomputerRENESAS ELECTRONICS CORP·Filed 2010·Granted Jul 19, 2011·0 cites·6 claims
- 2046US6092227ATest circuitMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Jul 18, 2000·11 cites·3 claims
- 2141US6040614ASemiconductor integrated circuit including a capacitor and a fuse elementMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 21, 2000·10 cites·5 claims
- 2240US12159605B2Unevenness correction data generation deviceIIX INC·Filed 2021·Granted Dec 3, 2024·0 cites·4 claims
- 2340US10750148B2Unevenness correction system, unevenness correction apparatus and panel drive circuitIIX INC·Filed 2016·Granted Aug 18, 2020·0 cites·3 claims
- 2440US2020184883A1Unevenness correction data generation deviceIIX INC·Filed 2017·Application pending·0 cites
- 2538US6025733ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 15, 2000·9 cites·3 claims
- 2635US11990104B2Input signal correction deviceIIX INC·Filed 2021·Granted May 21, 2024·0 cites·8 claims
- 2735US11823610B2Input signal correction deviceIIX INC·Filed 2021·Granted Nov 21, 2023·0 cites·8 claims
- 2834US2003067815A1Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating methodFiled 2002·Application pending·0 cites
- 2932US6043522AField effect transistor array including doped two-cell isolation region for preventing latchupMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Mar 28, 2000·3 cites·4 claims
- 3032US5491438ASynchronized clock generating apparatusMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 13, 1996·6 cites·14 claims
- 3130US2002162060A1Integrated circuit facilitating its unit testFiled 2001·Application pending·0 cites
- 3226US6570572B1Line delay generator using one-port RAMMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 27, 2003·0 cites·12 claims
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