Inventor · disambiguated record
Eckhard Kunigkeit
Also filed as: KUNIGKEIT ECKHARD
10 granted patents·1 pending application·32 citations·filing 1995–2017
83Inventor score
Files withIBM11
Top patents by PatentIndex Score
11 records- 0181US9885748B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 6, 2018·2 cites·18 claims
- 0277US9496188B2Soldering three dimensional integrated circuitsIBM·Filed 2015·Granted Nov 15, 2016·3 cites·19 claims
- 0364US6710269B2Foil keyboard with security systemIBM·Filed 2002·Granted Mar 23, 2004·18 cites·15 claims
- 0456US9891272B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 13, 2018·0 cites·9 claims
- 0552US9250289B2System for electrical testing and manufacturing of a 3-D chip stack and methodIBM·Filed 2013·Granted Feb 2, 2016·0 cites·13 claims
- 0647US10114069B2Method for electrical testing of a 3-D chip stackIBM·Filed 2015·Granted Oct 30, 2018·0 cites·4 claims
- 0746US10684930B2Functional testing of high-speed serial linksIBM·Filed 2017·Granted Jun 16, 2020·0 cites·20 claims
- 0845US9921268B2Auto-alignment of backer plate for direct docking test boardsIBM·Filed 2015·Granted Mar 20, 2018·0 cites·20 claims
- 0939US2003229795A1Secure assembly of security keyboardsIBM·Filed 2003·Application pending·0 cites
- 1034US9726719B2Semiconductor automatic test equipmentIBM·Filed 2015·Granted Aug 8, 2017·0 cites·20 claims
- 1129US5794365AMethod and apparatus for turning a page in a bookIBM·Filed 1995·Granted Aug 18, 1998·9 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →