Inventor · disambiguated record
Alan B. Harker
Also filed as: HARKER ALAN B
10 granted patents·3 pending applications·849 citations·filing 1977–2006
92Inventor score
Files withROCKWELL INTERNATIONAL CORP5KENDIG MARTIN W2BOEING CO1ROCKWELL SCIENCE CENTER LLC1TELEDYNE LICENSING LLC1
Top patents by PatentIndex Score
13 records- 0197US7256943B1Variable focus liquid-filled lens using polyphenyl ethersTELEDYNE LICENSING LLC·Filed 2006·Granted Aug 14, 2007·137 cites·20 claims
- 0295US5349154ADiamond growth by microwave generated plasma flameROCKWELL INTERNATIONAL CORP·Filed 1992·Granted Sep 20, 1994·127 cites·13 claims
- 0394US5936150AThin film resonant chemical sensor with resonant acoustic isolatorROCKWELL SCIENCE CENTER LLC·Filed 1998·Granted Aug 10, 1999·321 cites·14 claims
- 0492US4423623AMicrowave meter for fluid mixturesROCKWELL INTERNATIONAL CORP·Filed 1981·Granted Jan 3, 1984·80 cites·11 claims
- 0591US5242711ANucleation control of diamond films by microlithographic patterningROCKWELL INTERNATIONAL CORP·Filed 1991·Granted Sep 7, 1993·115 cites·9 claims
- 0683US5334342AMethod of fabricating of diamond moth-eye surfaceROCKWELL INTERNATIONAL CORP·Filed 1993·Granted Aug 2, 1994·46 cites·20 claims
- 0765US7108819B2Process for fabricating high aspect ratio embossing tool and microstructuresBOEING CO·Filed 2003·Granted Sep 19, 2006·7 cites·9 claims
- 0860US4049383AMethod of detecting gaseous contaminantsROCKWELL INTERNATIONAL CORP·Filed 1977·Granted Sep 20, 1977·16 cites·10 claims
- 0950US9266733B2Multilayer self-decontaminating coatingsKENDIG MARTIN W·Filed 2005·Granted Feb 23, 2016·0 cites·21 claims
- 1050US8834687B2Multilayer self-decontaminating coatingsKENDIG MARTIN W·Filed 2006·Granted Sep 16, 2014·0 cites·15 claims
- 1146US2003038033A1Process for fabricating high aspect ratio embossing tool and microstructuresFiled 2001·Application pending·0 cites
- 1243US2003201241A1Tool for embossing high aspect ratio microstructuresFiled 2003·Application pending·0 cites
- 1337US2003038105A1Tool for embossing high aspect ratio microstructuresFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →