Inventor · disambiguated record
Masatoshi Yasutake
Also filed as: YASUTAKE MASATOSHI
51 granted patents·4 pending applications·989 citations·filing 1977–2018
98Inventor score
Files withSEIKO INSTR INC21SII NANOTECHNOLOGY INC13MITSUBISHI ELECTRIC CORP3NAKAYAMA YOSHIKAZU3YASUTAKE MASATOSHI3
Top patents by PatentIndex Score
55 records- 0192US4999495AScanning tunneling microscopeSEIKO INSTR INC·Filed 1989·Granted Mar 12, 1991·101 cites·6 claims
- 0289US5117110AComposite scanning tunnelling microscope with a positioning functionSEIKO INSTR INC·Filed 1990·Granted May 26, 1992·84 cites·2 claims
- 0386US6864481B2Probe for scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2002·Granted Mar 8, 2005·62 cites·22 claims
- 0484US5142145AComposite scanning tunneling microscopeSEIKO INSTR INC·Filed 1990·Granted Aug 25, 1992·61 cites·4 claims
- 0582US6759653B2Probe for scanning microscope produced by focused ion beam machiningYOSHIKAZU NAKAYAMA·Filed 2001·Granted Jul 6, 2004·32 cites·8 claims
- 0682US6355495B1Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereofMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Mar 12, 2002·27 cites·10 claims
- 0782US5440122ASurface analyzing and processing apparatusSEIKO INSTR INC·Filed 1994·Granted Aug 8, 1995·55 cites·11 claims
- 0881US5650614AOptical scanning system utilizing an atomic force microscope and an optical microscopeMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 22, 1997·66 cites·5 claims
- 0979US5324935AScanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric elementSEIKO INSTR INC·Filed 1993·Granted Jun 28, 1994·47 cites·6 claims
- 1077US7770474B2Sample operation apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 10, 2010·6 cites·6 claims
- 1175US7495215B2Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubesNAT INST OF ADVANCED IND SCIEN·Filed 2005·Granted Feb 24, 2009·6 cites·15 claims
- 1273US6787769B2Conductive probe for scanning microscope and machining method using the sameNAKAYAMA YOSHIKAZU·Filed 2001·Granted Sep 7, 2004·21 cites·9 claims
- 1372US6705154B2Cantilever for vertical scanning microscope and probe for vertical scan microscopeNAKAYAMA YOSHIKAZU·Filed 2001·Granted Mar 16, 2004·20 cites·9 claims
- 1472US5440121AScanning probe microscopeSEIKO INSTR INC·Filed 1993·Granted Aug 8, 1995·33 cites·4 claims
- 1570US5742172AScanning probe microscope and method for obtaining topographic image, surface potential image, and electrostatic capacitance distribution imageSEIKO INSTR INC·Filed 1996·Granted Apr 21, 1998·39 cites·24 claims
- 1669US8028567B2AFM tweezers, method for producing AFM tweezers, and scanning probe microscopeAOI ELECTRONICS CO LTD·Filed 2008·Granted Oct 4, 2011·4 cites·11 claims
- 1768US7259372B2Processing method using probe of scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 21, 2007·4 cites·14 claims
- 1867US7398678B2Probe for a scanning microscopeNAKAYAMA YOSHIKAZU·Filed 2005·Granted Jul 15, 2008·4 cites·3 claims
- 1967US5623205AMethod and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic fieldSEIKO INSTR INC·Filed 1994·Granted Apr 22, 1997·27 cites·18 claims
- 2066US6593571B1Scanning probe microscopeSEIKO INSTR INC·Filed 2000·Granted Jul 15, 2003·14 cites·23 claims
- 2166US5877035AAnalyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the sameMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 2, 1999·29 cites·33 claims
- 2265US6124142AMethod for analyzing minute foreign substance elementsSEIKO INSTR INC·Filed 1996·Granted Sep 26, 2000·27 cites·24 claims
- 2365US6094972ASampling scanning probe microscope and sampling method thereofSEIKO INSTR INC·Filed 1998·Granted Aug 1, 2000·32 cites·21 claims
- 2464US7232995B2Method of removing particle of photomask using atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 19, 2007·1 cites·6 claims
- 2563US7507957B2Probe microscope system suitable for observing sample of long bodySII NANOTECHNOLOGY INC·Filed 2005·Granted Mar 24, 2009·7 cites·8 claims
- 2662US6215121B1Three-dimensional scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Apr 10, 2001·28 cites·17 claims
- 2760US6051833AProbe scanning deviceSEIKO INSTR INC·Filed 1998·Granted Apr 18, 2000·22 cites·8 claims
- 2859US7866205B2Sample operation apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Jan 11, 2011·2 cites·6 claims
- 2958US8601609B2Friction force microscopeYASUTAKE MASATOSHI·Filed 2012·Granted Dec 3, 2013·1 cites·12 claims
- 3058US7987703B2Tweezer-equipped scanning probe microscope and transfer methodAOI ELECTRONICS CO LTD·Filed 2008·Granted Aug 2, 2011·2 cites·12 claims
- 3158US6255127B1Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the sameSEIKO INSTR INC·Filed 1998·Granted Jul 3, 2001·20 cites·10 claims
- 3257US8001831B2Positioning apparatus and scanning probe microscope employing the sameSII NANOTECHNOLOGY INC·Filed 2008·Granted Aug 23, 2011·2 cites·9 claims
- 3357US7278299B2Method of processing vertical cross-section using atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 9, 2007·2 cites·5 claims
- 3456US7926328B2Sample manipulating apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Apr 19, 2011·2 cites·12 claims
- 3555US11143606B2Particle measuring device and particle measuring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·0 cites·15 claims
- 3655US10697767B2Sample for measuring particles, method for measuring particles and apparatus for measuring particlesHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 30, 2020·0 cites·6 claims
- 3755US5423514AAlignment assembly for aligning a spring element with a laser beam in a probe microscopeSEIKO INSTR INC·Filed 1994·Granted Jun 13, 1995·16 cites·2 claims
- 3854US7476418B2Method for fabricating nanometer-scale structureSII NANOTECHNOLOGY INC·Filed 2004·Granted Jan 13, 2009·1 cites·24 claims
- 3953US6817231B2Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereofSEIKO INSTR INC·Filed 2002·Granted Nov 16, 2004·10 cites·20 claims
- 4053US5489339AMicroelectronic processing machineSEIKO INSTR INC·Filed 1994·Granted Feb 6, 1996·15 cites·12 claims
- 4151US8657962B2Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatusHAYASHI HIROKI·Filed 2008·Granted Feb 25, 2014·1 cites·11 claims
- 4251US7373806B2Scanning probe microscope and scanning methodSII NANOTECHNOLOGY INC·Filed 2004·Granted May 20, 2008·6 cites·26 claims
- 4348US6078044AProbe scanning apparatusSEIKO INSTR INC·Filed 1997·Granted Jun 20, 2000·13 cites·21 claims
- 4446US4126032AMethod and apparatus for determining photo-chemical reaction heatSEIKO INSTR & ELECTRONICS·Filed 1977·Granted Nov 21, 1978·10 cites·3 claims
- 4546US2004185586A1Preparation of sample chip, method of observing wall surface thereof and system thereforFiled 2004·Application pending·0 cites
- 4645US6291822B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Sep 18, 2001·11 cites·7 claims
- 4744US2007278177A1Processing method using atomic force microscope microfabrication deviceKONDO KAZUSHIGE·Filed 2007·Application pending·0 cites
- 4843US6499340B1Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscopeSEIKO INSTR INC·Filed 1999·Granted Dec 31, 2002·11 cites·14 claims
- 4941US7442925B2Working method using scanning probeSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·0 cites·20 claims
- 5039US2004154744A1Method and system for surface or cross-sectional processing and observationFiled 2004·Application pending·0 cites
Showing the top 50 of 55 patent records by PatentIndex Score.
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