Assignee
YASUTAKE MASATOSHI
JP·2 granted patents·1 pending application·1 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0158US8601609B2Friction force microscopeYASUTAKE MASATOSHI·Filed 2012·Granted Dec 3, 2013·1 cites·12 claims
- 0237US8111079B2Conductivity measuring apparatus and conductivity measuring methodYASUTAKE MASATOSHI·Filed 2009·Granted Feb 7, 2012·0 cites·13 claims
- 0337US2009188011A1Tweezers system for scanning probe microscope, scanning probe microscope apparatus and method of removing dustYASUTAKE MASATOSHI·Filed 2009·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →