Inventor · disambiguated record
Ming-Chung Wu
Also filed as: WU MING C · WU MING-CHUNG
8 granted patents·5 pending applications·15 citations·filing 2006–2025
77Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD7UNIV NAT TAIWAN2INER AEC EXECUTIVE YUAN1LEE WEI-CHEN1REALTEK SEMICONDUCTOR CORP1
Top patents by PatentIndex Score
13 records- 0188US9146222B2System for detecting volatile organic compounds and the method for forming the same and utility thereofUNIV NAT TAIWAN·Filed 2013·Granted Sep 29, 2015·14 cites·29 claims
- 0279US2025364373A1Semiconductor package structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0377US12125810B2Delamination sensorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 22, 2024·0 cites·20 claims
- 0477US2024387411A1Delamination sensorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0569US11616029B2Delamination sensorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 28, 2023·0 cites·20 claims
- 0668US12469768B2Semiconductor package structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Nov 11, 2025·0 cites·20 claims
- 0762US11143818B2Multi-mode interference (MMI) based laser devices for heterogeneous platformsSAKIB MEER NAZMUS·Filed 2019·Granted Oct 12, 2021·1 cites·22 claims
- 0859US2025253225A1Redistribution layer having guard members and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0958US2025226269A1Test pad structure and method of manufacturing and operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1048US8244487B2Measuring systemLEE WEI-CHEN·Filed 2009·Granted Aug 14, 2012·0 cites·12 claims
- 1147US2010101641A1Solar cell coating and method for manufacturing the sameINER AEC EXECUTIVE YUAN·Filed 2009·Application pending·0 cites
- 1245US7598022B2Positive and negative dual function magnetic resist lithographyUNIV NAT TAIWAN·Filed 2006·Granted Oct 6, 2009·0 cites·43 claims
- 1344US9568553B2Method of integrated circuit scan clock domain allocation and machine readable media thereofREALTEK SEMICONDUCTOR CORP·Filed 2013·Granted Feb 14, 2017·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →