Inventor · disambiguated record
Hirotoshi Sato
Also filed as: SATO HIROTOSHI
50 granted patents·3 pending applications·662 citations·filing 1992–2020
98Inventor score
Files withMITSUBISHI ELECTRIC CORP23HITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD11RENESAS TECH CORP11RENESAS ELECTRONICS CORP2AGARI TAKESHI1
Top patents by PatentIndex Score
53 records- 0187US11662294B2Fan filter unit and HEPA filter performance measurement methodHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2020·Granted May 30, 2023·2 cites·9 claims
- 0286US11559813B2Safety cabinetHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2018·Granted Jan 24, 2023·2 cites·13 claims
- 0385US11534749B2Safety cabinet, and vibration damping mechanism for fan filter unitHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2018·Granted Dec 27, 2022·2 cites·2 claims
- 0484US5754480ASemiconductor device including an output buffer circuit that can output data while establishing impedance matching with an external data transmission lineMITSUBISHI ELECTRIC CORP·Filed 1996·Granted May 19, 1998·47 cites·4 claims
- 0583US7826298B2Semiconductor memory device with low standby currentRENESAS ELECTRONICS CORP·Filed 2008·Granted Nov 2, 2010·15 cites·11 claims
- 0683US5966319AStatic memory device allowing correct data readingMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 12, 1999·56 cites·20 claims
- 0782US10874012B2Biosafety cabinet and clean air deviceHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2017·Granted Dec 22, 2020·1 cites·6 claims
- 0882US10350588B2Clean air apparatusHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2015·Granted Jul 16, 2019·3 cites·13 claims
- 0981US11543139B2Safety cabinetHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2019·Granted Jan 3, 2023·2 cites·8 claims
- 1081US6859415B2Fully-hidden refresh dynamic random access memoryRENESAS TECH CORP·Filed 2003·Granted Feb 22, 2005·20 cites·12 claims
- 1179US6813211B2Fully hidden refresh dynamic random access memoryRENESAS TECH CORP·Filed 2003·Granted Nov 2, 2004·23 cites·9 claims
- 1279US6697910B2Semiconductor memory device having refresh circuitRENESAS TECH CORP·Filed 2001·Granted Feb 24, 2004·27 cites·11 claims
- 1378US6294404B1Semiconductor integrated circuit having function of reducing a power consumption and semiconductor integrated circuit system comprising this semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 25, 2001·25 cites·20 claims
- 1476US10525458B2Clean air device and air cleaning unit inspecting methodHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2014·Granted Jan 7, 2020·3 cites·6 claims
- 1576US7887289B2Blower systemHITACHI IND EQUIPMENT SYS·Filed 2007·Granted Feb 15, 2011·8 cites·8 claims
- 1675US5864511ASemiconductor memory device using cross-coupled load and precharge circuit for bit line pairsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 26, 1999·37 cites·20 claims
- 1773US6118154AInput/output protection circuit having an SOI structureMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 12, 2000·33 cites·21 claims
- 1872US8297921B2Blower systemTOKUNAGA TAICHI·Filed 2011·Granted Oct 30, 2012·4 cites·6 claims
- 1969US6577553B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 10, 2003·14 cites·16 claims
- 2069US6507337B1Touch panelGUNZE KK·Filed 1999·Granted Jan 14, 2003·63 cites·17 claims
- 2169US5602798ASynchronous semiconductor memory device operable in a snooze modeMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Feb 11, 1997·28 cites·10 claims
- 2269US5317213ALevel converter with delay circuitry used to increase switching speedMITSUBISHI ELECTRIC CORP·Filed 1992·Granted May 31, 1994·21 cites·25 claims
- 2368US5946251ABit line equalize circuit of semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 31, 1999·29 cites·20 claims
- 2467US7357385B2Machining jigYAMAZAKI MAZAK CORP·Filed 2005·Granted Apr 15, 2008·3 cites·6 claims
- 2567US7061828B2Fully-hidden refresh dynamic random access memoryRENESAS TECH CORP·Filed 2005·Granted Jun 13, 2006·4 cites·4 claims
- 2667US6882586B2Semiconductor memory device equipped with control circuit for controlling memory cell array in non-normal operation modeRENESAS TECH CORP·Filed 2002·Granted Apr 19, 2005·15 cites·8 claims
- 2767US5841961ASemiconductor memory device including a tag memoryMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Nov 24, 1998·26 cites·13 claims
- 2867US5708599ASemiconductor memory device capable of reducing power consumptionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jan 13, 1998·26 cites·13 claims
- 2965US8593859B2Semiconductor device for preventing erroneous write to memory cell in switching operational mode between normal mode and standby modeAGARI TAKESHI·Filed 2011·Granted Nov 26, 2013·4 cites·12 claims
- 3063US6388857B1Semiconductor circuit device with improved surge resistanceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 14, 2002·18 cites·13 claims
- 3160US6556485B2Output buffer capable of adjusting current drivability and semiconductor integrated circuit device having the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 29, 2003·11 cites·17 claims
- 3260US5734280ASemiconductor integrated circuit device having power on reset circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 31, 1998·16 cites·8 claims
- 3357US11112143B2Fan filter unit, sterilization apparatus and clean roomHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2018·Granted Sep 7, 2021·0 cites·10 claims
- 3457US6707735B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Mar 16, 2004·9 cites·16 claims
- 3556US11273438B2Safety cabinetHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2018·Granted Mar 15, 2022·0 cites·1 claims
- 3656US6956758B2Fully-hidden refresh dynamic random access memoryRENESAS TECH CORP·Filed 2005·Granted Oct 18, 2005·2 cites·7 claims
- 3756US6584013B2Semiconductor memory device having increased memory capacity while reducing mounting area and stand-by currentMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 24, 2003·9 cites·9 claims
- 3852US10830462B2Clean air deviceHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2016·Granted Nov 10, 2020·0 cites·7 claims
- 3951US7894292B2Semiconductor device for preventing erroneous write to memory cell in switching operational mode between normal mode and standby modeRENESAS ELECTRONICS CORP·Filed 2009·Granted Feb 22, 2011·2 cites·10 claims
- 4051US5764565AStatic type semiconductor memory device with two word lines for one rowMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 9, 1998·14 cites·11 claims
- 4149US6301678B1Test circuit for reducing test time in semiconductor memory device having multiple data input/output terminalsMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 9, 2001·11 cites·15 claims
- 4246US2020171188A1Safety Cabinet and Method for Sterilizing SameHITACHI INDUSTRY EQUIPMENT SYSTEMS CO LTD·Filed 2017·Application pending·0 cites
- 4344US5546352ASemiconductor memory device having decoderMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Aug 13, 1996·9 cites·23 claims
- 4442US6493279B2Semiconductor device capable of simple measurement of oscillation frequencyMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 10, 2002·3 cites·9 claims
- 4541US7145832B2Fully-hidden refresh dynamic random access memoryRENESAS TECH CORP·Filed 2006·Granted Dec 5, 2006·0 cites·2 claims
- 4641US5793670AStatic semiconductor memory device including a bipolar transistor in a memory cell, semiconductor device including bipolar transistors and method of manufacturing bipolar transistorsMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Aug 11, 1998·7 cites·10 claims
- 4740USRE41245ESemiconductor memory deviceRENESAS TECH CORP·Filed 2005·Granted Apr 20, 2010·0 cites·31 claims
- 4838US6795943B2Semiconductor device with test modeRENESAS TECH CORP·Filed 2001·Granted Sep 21, 2004·2 cites·7 claims
- 4938US5963470AStatic semiconductor memory cell with improved data retention stabilityMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 5, 1999·6 cites·3 claims
- 5037US2003183926A1Semiconductor device and semiconductor packaging deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →