Inventor · disambiguated record
Glen Gilfeather
Also filed as: GILFEATHER GLEN · GILFEATHER GLEN P · GILFEATHER GLEN PATRICK
20 granted patents·330 citations·filing 1987–2002
95Inventor score
Top patents by PatentIndex Score
20 records- 0189US4819047AProtection system for CMOS integrated circuitsADVANCED MICRO DEVICES INC·Filed 1987·Granted Apr 4, 1989·64 cites·6 claims
- 0284US4870530AElectrostatic discharge protection circuitry for any two external pins of an I.C. packageADVANCED MICRO DEVICES INC·Filed 1988·Granted Sep 26, 1989·67 cites·3 claims
- 0379US7088852B1Three-dimensional tomographyADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 8, 2006·16 cites·13 claims
- 0475US6897664B1Laser beam induced phenomena detectionSEMICAPS PTE LTD·Filed 2002·Granted May 24, 2005·24 cites·22 claims
- 0572US6069366AEndpoint detection for thinning of silicon of a flip chip bonded integrated circuitADVANCED MICRO DEVICES INC·Filed 1998·Granted May 30, 2000·27 cites·29 claims
- 0669US6469529B1Time-resolved emission microscopy systemADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 22, 2002·14 cites·40 claims
- 0762US6518661B1Apparatus for metal stack thermal management in semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 11, 2003·11 cites·14 claims
- 0862US6285036B1Endpoint detection for thinning of silicon of a flip chip bonded integrated circuitADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 4, 2001·8 cites·10 claims
- 0961US6372627B1Method and arrangement for characterization of focused-ion-beam insulator depositionADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 16, 2002·22 cites·35 claims
- 1061US5972725ADevice analysis for face down chipADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 26, 1999·25 cites·5 claims
- 1160US6844928B1Fiber optic semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 18, 2005·3 cites·19 claims
- 1258US6716683B1Optical analysis for SOI integrated circuitsADVANCED MIRCOR DEVICES INC·Filed 2001·Granted Apr 6, 2004·6 cites·30 claims
- 1358US6566888B1Repair of resistive electrical connections in an integrated circuitADVANCED MICRO DEVICES INC·Filed 2001·Granted May 20, 2003·8 cites·23 claims
- 1453US6833718B1Photon beaconADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 21, 2004·7 cites·16 claims
- 1553US6700659B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 2, 2004·6 cites·33 claims
- 1648US6635839B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 21, 2003·4 cites·23 claims
- 1742US6171944B1Method for bringing up lower level metal nodes of multi-layered integrated circuits for signal acquisitionADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 9, 2001·9 cites·9 claims
- 1836US6661246B1Constant-current VDDQ testing of integrated circuitsADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 9, 2003·0 cites·29 claims
- 1936US6352871B1Probe grid for integrated circuit excitationADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 5, 2002·5 cites·30 claims
- 2035US6455334B1Probe grid for integrated circuit analysisADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 24, 2002·4 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →