Inventor · disambiguated record
Tomohide Watanabe
Also filed as: WATANABE TOMOHIDE
7 granted patents·1 pending application·119 citations·filing 1978–2009
85Inventor score
Top patents by PatentIndex Score
8 records- 0183US4577095AAutomatic focusing apparatus for a semiconductor pattern inspection systemTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Mar 18, 1986·42 cites·6 claims
- 0275US4230940AAutomatic focusing apparatusTOKYO SHIBAURA ELECTRIC CO·Filed 1978·Granted Oct 28, 1980·29 cites·15 claims
- 0366US7394048B2Focusing device, focusing method and a pattern inspecting apparatusTOSHIBA KK·Filed 2007·Granted Jul 1, 2008·2 cites·6 claims
- 0451US8358340B2Pattern inspection device and method of inspecting patternTOSHIBA KK·Filed 2009·Granted Jan 22, 2013·0 cites·11 claims
- 0551US5379348APattern defects inspection systemTOSHIBA KK·Filed 1993·Granted Jan 3, 1995·22 cites·18 claims
- 0649US4743768AMethod and apparatus for measuring non-linearity of a pattern edgeTOSHIBA KK·Filed 1986·Granted May 10, 1988·12 cites·13 claims
- 0746US5602645APattern evaluation apparatus and a method of pattern evaluationTOSHIBA KK·Filed 1995·Granted Feb 11, 1997·12 cites·13 claims
- 0843US2008055606A1Apparatus and method for inspecting a pattern and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →