Inventor · disambiguated record
Kent B. Erington
Also filed as: ERINGTON KENT · ERINGTON KENT B · ERINGTON KENT BRADLEY
7 granted patents·2 pending applications·63 citations·filing 1996–2022
81Inventor score
Top patents by PatentIndex Score
9 records- 0184US10352995B1System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor deviceNXP USA INC·Filed 2018·Granted Jul 16, 2019·4 cites·20 claims
- 0284US7872489B2Radiation induced fault analysisFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jan 18, 2011·19 cites·20 claims
- 0368US6169408B1Method and apparatus for testing an integrated circuit with a pulsed radiation beamMOTOROLA INC·Filed 1996·Granted Jan 2, 2001·37 cites·34 claims
- 0463US10191111B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2014·Granted Jan 29, 2019·1 cites·39 claims
- 0561US11047906B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2019·Granted Jun 29, 2021·0 cites·25 claims
- 0652US7973545B2Time resolved radiation assisted device alterationFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jul 5, 2011·2 cites·20 claims
- 0751US2024047281A1Structure and method for test-point access in a semiconductorNXP USA INC·Filed 2022·Application pending·0 cites
- 0850US10782343B2Digital tests with radiation induced upsetsNXP USA INC·Filed 2018·Granted Sep 22, 2020·0 cites·16 claims
- 0932US2009147255A1Method for testing a semiconductor device and a semiconductor device testing systemERINGTON KENT B·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →