Inventor · disambiguated record
Jong-Ahn Kim
Also filed as: KIM JONG-AHN
10 granted patents·1 pending application·22 citations·filing 1987–2019
82Inventor score
Files withKOREA RES INST STANDARDS & SCI5KIM JAE WAN2KOREA RES INST OF STANDARDS2JIN JONG HAN1SAMSUNG ELECTRONICS CO LTD1
Top patents by PatentIndex Score
11 records- 0183US8279448B2Shape measurement apparatus and methodKIM JAE-WAN·Filed 2008·Granted Oct 2, 2012·12 cites·14 claims
- 0272US9019368B2Spatial phase shifting interferometer using multi wavelengthKOREA RES INST OF STANDARDS·Filed 2012·Granted Apr 28, 2015·3 cites·16 claims
- 0364US9121696B2Device and method for measuring via hole of silicon waferJIN JONG HAN·Filed 2011·Granted Sep 1, 2015·2 cites·10 claims
- 0462US9651403B2Absolute position measurement method, absolute position measurement apparatus and scaleKOREA RES INST STANDARDS & SCI·Filed 2014·Granted May 16, 2017·1 cites·29 claims
- 0558US10801864B2Absolute position measuring method, absolute position measuring apparatus, and colour scale comprising plural symbols each with plural segments of different color patternsKOREA RES INST STANDARDS & SCI·Filed 2019·Granted Oct 13, 2020·0 cites·14 claims
- 0650US9921051B2Thickness measuring apparatus and thickness measuring methodKOREA RES INST STANDARDS & SCI·Filed 2014·Granted Mar 20, 2018·0 cites·21 claims
- 0746US8290007B2Apparatus and method for stabilizing frequency of laserKIM JAE-WAN·Filed 2008·Granted Oct 16, 2012·0 cites·11 claims
- 0844US11378665B2Distance measuring apparatus and method of operating the sameKOREA RES INST STANDARDS & SCI·Filed 2017·Granted Jul 5, 2022·0 cites·18 claims
- 0942US2015009509A1Transparent substrate monitoring apparatus and transparent substrate methodKOREA RES INST OF STANDARDS·Filed 2014·Application pending·0 cites
- 1034US9927224B2Thickness measuring apparatus and thickness measuring methodKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Mar 27, 2018·0 cites·12 claims
- 1122US4870507AVideo tape recorder systemSAMSUNG ELECTRONICS CO LTD·Filed 1987·Granted Sep 26, 1989·4 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →