Inventor · disambiguated record
Nikila Krishnamoorthy
Also filed as: KRISHNAMOORTHY NIKILA
11 granted patents·113 citations·filing 2003–2022
87Inventor score
Top patents by PatentIndex Score
11 records- 0192US10955473B1System and method of scan reset upon entering scan modeNXP BV·Filed 2019·Granted Mar 23, 2021·5 cites·20 claims
- 0291US7134061B2At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platformTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 7, 2006·69 cites·5 claims
- 0386US8458541B2System and method for debugging scan chainsJAIN SANDEEP·Filed 2011·Granted Jun 4, 2013·10 cites·12 claims
- 0482US11686769B1Signal toggling detection and correction circuitNXP BV·Filed 2022·Granted Jun 27, 2023·1 cites·20 claims
- 0576US11144677B2Method and apparatus for digital only secure test mode entryNXP USA INC·Filed 2019·Granted Oct 12, 2021·3 cites·21 claims
- 0671US6925408B2Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital componentsTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 2, 2005·19 cites·15 claims
- 0760US12196804B2System for scan mode exit and methods for scan mode exitNXP BV·Filed 2022·Granted Jan 14, 2025·0 cites·18 claims
- 0859US7421634B2Sequential scan based techniques to test interface between modules designed to operate at different frequenciesTEXAS INSTRUMENTS INC·Filed 2005·Granted Sep 2, 2008·4 cites·12 claims
- 0948US11879939B2System and method for testing clocking systems in integrated circuitsNXP BV·Filed 2022·Granted Jan 23, 2024·0 cites·20 claims
- 1038US7120842B2Mechanism to enhance observability of integrated circuit failures during burn-in testsTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 10, 2006·2 cites·15 claims
- 1136US7213184B2Testing of modules operating with different characteristics of control signals using scan based techniquesTEXAS INSTRUMENTS INC·Filed 2004·Granted May 1, 2007·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →