Inventor · disambiguated record
Soo-Bok Chin
Also filed as: CHIN SOO-BOK
4 granted patents·4 pending applications·5 citations·filing 2011–2016
62Inventor score
Top patents by PatentIndex Score
8 records- 0177US9322771B2Apparatus and method for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 26, 2016·4 cites·18 claims
- 0256US8890069B2Method for detecting defect of substrateSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 18, 2014·1 cites·19 claims
- 0346US9165354B2Method of analyzing photolithography processesSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Oct 20, 2015·0 cites·19 claims
- 0444US9551653B2Methods for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 24, 2017·0 cites·14 claims
- 0540US2014342477A1Method of monitoring semiconductor fabrication process using xpsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0637US2014307052A1Apparatuses and methods for extracting defect depth information and methods of improving semiconductor device manufacturing processes using defect depth informationSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0732US2012082367A1Method of forming image of semiconductor device, and method of detecting a defect of the semiconductor device by using the image forming methodBYUN JUNG-HOON·Filed 2011·Application pending·0 cites
- 0831US2015219446A1Methods and apparatuses for measuring values of parameters of integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →