Inventor · disambiguated record
Choon-Shik Leem
Also filed as: LEEM CHOON-SHIK
4 granted patents·2 pending applications·5 citations·filing 2014–2016
62Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0177US9322771B2Apparatus and method for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 26, 2016·4 cites·18 claims
- 0256US10281412B2Apparatus for measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted May 7, 2019·1 cites·15 claims
- 0344US9551653B2Methods for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 24, 2017·0 cites·14 claims
- 0440US2014342477A1Method of monitoring semiconductor fabrication process using xpsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0537US9939388B2Apparatus for inspecting waferSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 10, 2018·0 cites·17 claims
- 0631US2015219446A1Methods and apparatuses for measuring values of parameters of integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Choon-Shik Leem files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →