Inventor · disambiguated record
Maximilian Haider
Also filed as: HAIDER MAXIMILIAN
9 granted patents·197 citations·filing 1990–2017
91Inventor score
Files withZEISS CARL MICROSCOPY GMBH3CARL ZEISS SMT A G1CEOS GMBH1INTEGRATED CIRCUIT TESTING1KNIPPELMEYER RAINER1
Top patents by PatentIndex Score
9 records- 0196US9224576B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Dec 29, 2015·18 cites·10 claims
- 0296US7554094B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsCARL ZEISS SMT A G·Filed 2007·Granted Jun 30, 2009·29 cites·23 claims
- 0394US9673024B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsZEISS CARL MICROSCOPY GMBH·Filed 2015·Granted Jun 6, 2017·9 cites·15 claims
- 0493US8097847B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsKNIPPELMEYER RAINER·Filed 2009·Granted Jan 17, 2012·16 cites·12 claims
- 0591US6770878B2Electron/ion gun for electron or ion beams with high monochromasy or high current densityCEOS GMBH·Filed 2001·Granted Aug 3, 2004·44 cites·8 claims
- 0689US10504681B2Particle-optical systems and arrangements and particle-optical components for such systems and arrangementsZEISS CARL MICROSCOPY GMBH·Filed 2017·Granted Dec 10, 2019·3 cites·14 claims
- 0782US6605810B1Device for correcting third-order spherical aberration in a lens, especially the objective lens of an electronic microscopeFiled 1998·Granted Aug 12, 2003·42 cites·6 claims
- 0871US6646267B1Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systemsFiled 1998·Granted Nov 11, 2003·24 cites·13 claims
- 0949US5021670AMultipole elementINTEGRATED CIRCUIT TESTING·Filed 1990·Granted Jun 4, 1991·12 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →