Inventor · disambiguated record
Yuji Miyagi
Also filed as: MIYAGI YUJI
9 granted patents·2 pending applications·65 citations·filing 2001–2011
86Inventor score
Top patents by PatentIndex Score
11 records- 0181US7586316B2Probe board mounting apparatusNIHON MICRONICS KK·Filed 2008·Granted Sep 8, 2009·12 cites·8 claims
- 0276US7468610B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Dec 23, 2008·9 cites·6 claims
- 0373US7667472B2Probe assembly, method of producing it and electrical connecting apparatusNIHON MICRONICS KK·Filed 2005·Granted Feb 23, 2010·7 cites·8 claims
- 0472US7924038B2Probe and electrical connecting apparatus using itNIHON MICRONICS KK·Filed 2007·Granted Apr 12, 2011·7 cites·8 claims
- 0568US6498504B2Wafer inspection device and wafer inspection methodNEC CORP·Filed 2001·Granted Dec 24, 2002·15 cites·7 claims
- 0664US7449906B2Probe for testing an electrical deviceNIHON MICRONICS KK·Filed 2003·Granted Nov 11, 2008·11 cites·15 claims
- 0759US7525329B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Apr 28, 2009·1 cites·8 claims
- 0856US7602200B2Probe for electrical test comprising a positioning mark and probe assemblyNIHON MICRONICS KK·Filed 2006·Granted Oct 13, 2009·3 cites·10 claims
- 0943US2008280542A1Cleaning apparatus for a probeNIHON MICRONICS KK·Filed 2008·Application pending·0 cites
- 1039US2008197869A1Electrical connecting apparatusNIHON MICRONICS KK·Filed 2008·Application pending·0 cites
- 1131US9097761B2Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatusYASUTA KATSUO·Filed 2011·Granted Aug 4, 2015·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →