Inventor · disambiguated record
Berthold Michelt
Also filed as: MICHELT BERTHOLD
5 granted patents·1 pending application·52 citations·filing 2007–2017
80Inventor score
Top patents by PatentIndex Score
6 records- 0191US9677871B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2015·Granted Jun 13, 2017·10 cites·15 claims
- 0290US9494409B2Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layerSCHÖNLEBER MARTIN·Filed 2012·Granted Nov 15, 2016·15 cites·4 claims
- 0389US9982994B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2017·Granted May 29, 2018·7 cites·27 claims
- 0484US9500471B2Optical measuring device and method for acquiring in situ a stage height between a support and an edge region of an objectPRECITEC OPTRONIK GMBH·Filed 2014·Granted Nov 22, 2016·11 cites·15 claims
- 0580US8716039B2Monitoring apparatus and method for in-situ measurement of wafer thicknesses for monitoring the thinning of semiconductor wafers and thinning apparatus comprising a wet etching apparatus and a monitoring apparatusDUSEMUND CLAUS·Filed 2011·Granted May 6, 2014·9 cites·20 claims
- 0635US2007242279A1Device and method for the contactless measurement of at least one curved surfaceMICHELT BERTHOLD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →