Inventor · disambiguated record
Brian N. Caldwell
Also filed as: CALDWELL BRIAN N · CALDWELL BRIAN NEAL
7 granted patents·31 citations·filing 2003–2016
79Inventor score
Top patents by PatentIndex Score
7 records- 0178US7198276B2Adaptive electrostatic pin chuckIBM·Filed 2003·Granted Apr 3, 2007·25 cites·28 claims
- 0273US7496885B1Method of compensating for defective pattern generation data in a variable shaped electron beam systemIBM·Filed 2008·Granted Feb 24, 2009·4 cites·1 claims
- 0372US8227774B2Method and system for feature function aware priority printingCALDWELL BRIAN N·Filed 2010·Granted Jul 24, 2012·2 cites·22 claims
- 0457US9372394B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2014·Granted Jun 21, 2016·0 cites·14 claims
- 0555US9996000B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2016·Granted Jun 12, 2018·0 cites·17 claims
- 0655US9989843B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2016·Granted Jun 5, 2018·0 cites·6 claims
- 0751US8586950B2Method and system for feature function aware priority printingCALDWELL BRIAN N·Filed 2012·Granted Nov 19, 2013·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →