Inventor · disambiguated record
Takahiro Arakawa
Also filed as: ARAKAWA TAKAHIRO
17 granted patents·7 pending applications·282 citations·filing 1989–2023
92Inventor score
Files withROHM CO LTD7FUJITSU LTD4IHI INSPECTION AND INSTR CO LTD2ISHIKAWAJIMA HARIMA HEAVY IND2OHMI TADAHIRO2
Top patents by PatentIndex Score
24 records- 0192US7719689B2AE/ultrasound detection system, and material monitoring apparatus and nondestructive inspection apparatus equipped the systemNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted May 18, 2010·28 cites·8 claims
- 0290US6388632B1Slot antenna used for plasma surface processing apparatusROHM CO LTD·Filed 2000·Granted May 14, 2002·88 cites·16 claims
- 0389US6693612B1Liquid crystal display apparatus and its luminance control methodHITACHI LTD·Filed 2000·Granted Feb 17, 2004·98 cites·3 claims
- 0484US6640632B1Ultrasonic flaw detection method and apparatusISHIKAWAJIMA HARIMA HEAVY IND·Filed 2002·Granted Nov 4, 2003·39 cites·4 claims
- 0567US8513137B2Plasma processing apparatus and plasma processing methodOHMI TADAHIRO·Filed 2012·Granted Aug 20, 2013·1 cites·16 claims
- 0664US7899792B2Data-mismatch resolving apparatus, data-mismatch resolving method, and computer productFUJITSU LTD·Filed 2006·Granted Mar 1, 2011·6 cites·9 claims
- 0758US4961347AProbe for ultrasonic flaw detectorsISHIKAWAJIMA HARIMA HEAVY IND·Filed 1989·Granted Oct 9, 1990·18 cites·12 claims
- 0857US8741779B2Plasma processing apparatus and plasma processing methodROHM CO LTD·Filed 2013·Granted Jun 3, 2014·0 cites·16 claims
- 0956US8308897B2Plasma processing apparatus and plasma processing methodOHMI TADAHIRO·Filed 2001·Granted Nov 13, 2012·4 cites·23 claims
- 1056US2024154044A1Schottky barrier diodeROHM CO LTD·Filed 2023·Application pending·0 cites
- 1154US2025325959A1Material for trapping substance in gas phase, and method for trapping substance in gas phaseUNIV NAT CORP TOKYO MEDICAL & DENTAL·Filed 2022·Application pending·0 cites
- 1252US11293905B2Phased-array flaw-detection device and methodIHI INSPECTION AND INSTR CO LTD·Filed 2018·Granted Apr 5, 2022·0 cites·8 claims
- 1346US10066264B2Method for analyzing target nucleic acid, kit, and analyzerDNAFORM KK·Filed 2013·Granted Sep 4, 2018·0 cites·34 claims
- 1445US2013346363A1Data synchronization method, computer readable recording medium having stored therein data synchronization program, and data synchronization control deviceFUJITSU LTD·Filed 2013·Application pending·0 cites
- 1542US2021361224A1BIOLOGICAL GAS (VOCs) MEASURMENT DEVICEUNIV NAT CORP TOKYO MEDICAL & DENTAL·Filed 2018·Application pending·0 cites
- 1641US10957803B2Bidirectional Zener diode and method for manufacturing bidirectional Zener diodeROHM CO LTD·Filed 2019·Granted Mar 23, 2021·0 cites·16 claims
- 1740US2022353150A1Non-transitory computer-readable storage medium, information processing apparatus, and network map creation support methodFUJITSU LTD·Filed 2022·Application pending·0 cites
- 1835US2001014374A1Plasma treatment apparatus and electrode used for the sameFiled 2001·Application pending·0 cites
- 1934USD1052545SSemiconductor deviceROHM CO LTD·Filed 2023·Granted Nov 26, 2024·0 cites·1 claims
- 2034USD1043595SSemiconductor deviceROHM CO LTD·Filed 2023·Granted Sep 24, 2024·0 cites·1 claims
- 2134USD1043594SSemiconductor deviceROHM CO LTD·Filed 2023·Granted Sep 24, 2024·0 cites·1 claims
- 2231US8414782B2Process for producing fluorocarbon microstructure, fluorocarbon microstructure, and microsystemARAKAWA TAKAHIRO·Filed 2008·Granted Apr 9, 2013·0 cites·5 claims
- 2331US2017206143A1Management apparatus, management method, and computer-readable recording medium recorded with management programFUJITSU LTD·Filed 2017·Application pending·0 cites
- 2430US10345268B2Ultrasonic inspection device and methodIHI INSPECTION AND INSTR CO LTD·Filed 2015·Granted Jul 9, 2019·0 cites·5 claims
Join the waitlist — get patent alerts
Get an alert when Takahiro Arakawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →