Inventor · disambiguated record
Tzu-Chao Chen
Also filed as: CHEN TZU-CHAO
4 granted patents·1 pending application·3 citations·filing 2018–2024
59Inventor score
Files withASML NETHERLANDS BV5
Top patents by PatentIndex Score
5 records- 0182US11803127B2Method for determining root cause affecting yield in a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2019·Granted Oct 31, 2023·3 cites·20 claims
- 0269US11520238B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 0356US11150562B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2018·Granted Oct 19, 2021·0 cites·20 claims
- 0456US2024339295A1Method of generating a sample map, computer program product, charged particle inspection system, method of processing a sample, assessment methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0551US12315175B2Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the methodASML NETHERLANDS BV·Filed 2019·Granted May 27, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →