Inventor · disambiguated record
Hirohide Yano
Also filed as: YANO HIROHIDE
5 granted patents·15 citations·filing 2015–2022
71Inventor score
Files withDISCO CORP5
Top patents by PatentIndex Score
5 records- 0190US9616544B2Wafer inspection method and grinding and polishing apparatusDISCO CORP·Filed 2015·Granted Apr 11, 2017·10 cites·4 claims
- 0275US11474143B2Testing apparatusDISCO CORP·Filed 2019·Granted Oct 18, 2022·2 cites·16 claims
- 0370US9953407B2Wafer inspection method and wafer inspection apparatusDISCO CORP·Filed 2015·Granted Apr 24, 2018·3 cites·1 claims
- 0462US12298126B2Operation accuracy measuring methodDISCO CORP·Filed 2022·Granted May 13, 2025·0 cites·6 claims
- 0537US9881828B2Wafer processing methodDISCO CORP·Filed 2017·Granted Jan 30, 2018·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →