Inventor · disambiguated record
Morihisa Hirata
Also filed as: HIRATA MORIHISA
22 granted patents·1 pending application·280 citations·filing 1992–2012
95Inventor score
Top patents by PatentIndex Score
23 records- 0192US7869174B2Semiconductor device with a plurality of power supply systemsRENESAS ELECTRONICS CORP·Filed 2007·Granted Jan 11, 2011·20 cites·8 claims
- 0290US7076757B2Semiconductor integrated device and apparatus for designing the sameNEC ELECTRONICS CORP·Filed 2004·Granted Jul 11, 2006·19 cites·20 claims
- 0387US7631279B2Semiconductor integrated device and apparatus for designing the sameNEC ELECTRONICS CORP·Filed 2008·Granted Dec 8, 2009·4 cites·8 claims
- 0487US7624365B2Semiconductor integrated device and apparatus for designing the sameNEC ELECTRONICS CORP·Filed 2008·Granted Nov 24, 2009·7 cites·12 claims
- 0587US7552404B2Semiconductor integrated device and apparatus for designing the sameNEC ELECTRONICS CORP·Filed 2006·Granted Jun 23, 2009·4 cites·12 claims
- 0687US7312517B2System-in-package type semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Dec 25, 2007·14 cites·7 claims
- 0784US7853909B2ESD analysis device and ESD analysis program used for designing semiconductor device and method of designing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2007·Granted Dec 14, 2010·12 cites·20 claims
- 0883US5905287ASemiconductor device with high voltage protectionNEC CORP·Filed 1997·Granted May 18, 1999·58 cites·11 claims
- 0975US8749932B2Semiconductor device with a plurality of power supply systemsTANAKA MASANORI·Filed 2012·Granted Jun 10, 2014·3 cites·2 claims
- 1075US6469354B1Semiconductor device having a protective circuitNEC CORP·Filed 1999·Granted Oct 22, 2002·47 cites·5 claims
- 1174US6670679B2Semiconductor device having an ESD protective circuitNEC ELECTRONICS CORP·Filed 2002·Granted Dec 30, 2003·19 cites·19 claims
- 1272US8230373B2ESD analysis device and ESD analysis program used for designing semiconductor device and method of designing semiconductor deviceKOBAYASHI SUSUMU·Filed 2010·Granted Jul 24, 2012·3 cites·4 claims
- 1368US7196377B2MOS type semiconductor device having electrostatic discharge protection arrangementNEC ELECTRONICS CORP·Filed 2005·Granted Mar 27, 2007·4 cites·18 claims
- 1467US5449940ASemiconductor integrated circuit having improved protection elementNEC CORP·Filed 1992·Granted Sep 12, 1995·28 cites·6 claims
- 1554US6600210B1Semiconductor device and method of manufacturing the sameNEC ELECTRONICS CORP·Filed 2000·Granted Jul 29, 2003·6 cites·20 claims
- 1649US8270132B2Semiconductor device with a plurality of power supply systemsTANAKA MASANORI·Filed 2011·Granted Sep 18, 2012·0 cites·12 claims
- 1749US2008283986A1System-in-package type semiconductor deviceHIRATA MORIHISA·Filed 2007·Application pending·0 cites
- 1846US8008727B2Semiconductor integrated circuit device including a pad and first mosfetRENESAS ELECTRONICS CORP·Filed 2008·Granted Aug 30, 2011·0 cites·20 claims
- 1945US6191454B1Protective resistance element for a semiconductor deviceNEC CORP·Filed 1997·Granted Feb 20, 2001·12 cites·6 claims
- 2039US7986156B2Semiconductor device including address signal generating protion and digital-to-analog converterRENESAS ELECTRONICS CORP·Filed 2009·Granted Jul 26, 2011·0 cites·15 claims
- 2135US6321364B1Method for designing integrated circuit device based on maximum load capacityNEC CORP·Filed 1998·Granted Nov 20, 2001·8 cites·12 claims
- 2234US6629295B1Design automation method and deviceNEC CORP·Filed 1999·Granted Sep 30, 2003·8 cites·26 claims
- 2330US6975979B2Method and computer software product for calculating and presenting a numerical value representative of a property of a circuitNEC ELECTRONICS CORP·Filed 1999·Granted Dec 13, 2005·4 cites·4 claims
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