Inventor · disambiguated record
Shuji Hamada
Also filed as: HAMADA SHUJI
9 granted patents·3 pending applications·79 citations·filing 1985–2014
86Inventor score
Files withNIIGATA ENGINEERING CO LTD4FUJITSU SEMICONDUCTOR LTD3HAMADA SHUJI1SEMICONDUCTOR TECH ACAD RES CT1SOCIONEXT INC1
Top patents by PatentIndex Score
12 records- 0184US7952390B2Logic circuit having gated clock bufferFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted May 31, 2011·17 cites·10 claims
- 0267US4741130AMethod and apparatus for sandblasting a workpieceNIIGATA ENGINEERING CO LTD·Filed 1986·Granted May 3, 1988·25 cites·19 claims
- 0354US7984350B2Logic circuitry and recording mediumFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Jul 19, 2011·2 cites·7 claims
- 0449US6635823B2Cover for preventing water from entering a junction blockSUMITOMO WIRING SYSTEMS·Filed 2002·Granted Oct 21, 2003·9 cites·14 claims
- 0549US4753051AApparatus for processing workpiece with sandblastingNIIGATA ENGINEERING CO LTD·Filed 1985·Granted Jun 28, 1988·14 cites·8 claims
- 0646US2009040559A1Image forming apparatus, image forming method, and image processing programHAMADA SHUJI·Filed 2008·Application pending·0 cites
- 0740US9201995B2Circuit design support method, computer product, and circuit design support apparatusSOCIONEXT INC·Filed 2014·Granted Dec 1, 2015·0 cites·10 claims
- 0840US8816759B2Electric circuit and semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 26, 2014·0 cites·8 claims
- 0940US4798027AMethod of and apparatus for sandblasting workpieceNIIGATA ENGINEERING CO LTD·Filed 1987·Granted Jan 17, 1989·8 cites·16 claims
- 1035US2005182587A1Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereonSEMICONDUCTOR TECH ACAD RES CT·Filed 2005·Application pending·0 cites
- 1135US2015204944A1Programmable logic device and verification method thereforTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1234US4708582AMethod for feeding a workNIIGATA ENGINEERING CO LTD·Filed 1986·Granted Nov 24, 1987·4 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →