Inventor · disambiguated record
Blaze Messer
Also filed as: MESSER BLAZE · MESSER BLAZE J
5 granted patents·5 pending applications·1 citations·filing 2011–2025
61Inventor score
Top patents by PatentIndex Score
10 records- 0175US2025283760A1Optical emission spectroscopy for advanced process characterizationTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 0274US12306044B2Optical emission spectroscopy for advanced process characterizationTOKYO ELECTRON LTD·Filed 2022·Granted May 20, 2025·0 cites·20 claims
- 0363US12158374B2Time-resolved OES data collectionTOKYO ELECTRON LTD·Filed 2022·Granted Dec 3, 2024·0 cites·20 claims
- 0458US2025293012A1System and method for semiconductor processingTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0556US12362158B2Method for OES data collection and endpoint detectionTOKYO ELECTRON LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 0655US2025283814A1Method for optical emission spectroscopy (oes) detector signal sensitivity improvementTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0754US2024339309A1Advanced OES CharacterizationTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 0853US8664012B2Combined silicon oxide etch and contamination removal processGAYLORD RICHARD H·Filed 2011·Granted Mar 4, 2014·1 cites·19 claims
- 0953US2025138429A1Endpoint detection in dry development of photoresistTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1048US12191202B2Contact openings in semiconductor devicesTOKYO ELECTRON LTD·Filed 2021·Granted Jan 7, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →