Inventor · disambiguated record
Louis C. Hsu
Also filed as: HSU LOUIS · HSU LOUIS C · HSU LOUIS L · O'BRIEN LEGAL REPRESENTATIVE CATHERINE
68 granted patents·7 pending applications·810 citations·filing 2001–2012
99Inventor score
Top patents by PatentIndex Score
75 records- 0197US6864540B1High performance FET with elevated source/drain regionIBM·Filed 2004·Granted Mar 8, 2005·130 cites·26 claims
- 0296US7727888B2Interconnect structure and method for forming the sameIBM·Filed 2005·Granted Jun 1, 2010·50 cites·14 claims
- 0395US7657995B2Method of fabricating a microelectromechanical system (MEMS) switchIBM·Filed 2007·Granted Feb 9, 2010·29 cites·4 claims
- 0495US7394332B2Micro-cavity MEMS device and method of fabricating sameIBM·Filed 2005·Granted Jul 1, 2008·45 cites·18 claims
- 0595US7132323B2CMOS well structure and method of forming the sameIBM·Filed 2003·Granted Nov 7, 2006·99 cites·25 claims
- 0694US8598641B2Sea-of-fins structure on a semiconductor substrate and method of fabricationCHEN HOWARD H·Filed 2011·Granted Dec 3, 2013·16 cites·18 claims
- 0794US8471296B2FinFET fuse with enhanced current crowdingCHENG KANGGUO·Filed 2011·Granted Jun 25, 2013·20 cites·24 claims
- 0894US7732922B2Simultaneous grain modulation for BEOL applicationsIBM·Filed 2008·Granted Jun 8, 2010·29 cites·8 claims
- 0994US7298639B2Reprogrammable electrical fuseIBM·Filed 2005·Granted Nov 20, 2007·25 cites·17 claims
- 1093US8076190B2Sea-of-fins structure on a semiconductor substrate and method of fabricationCHEN HOWARD H·Filed 2009·Granted Dec 13, 2011·21 cites·4 claims
- 1193US7772649B2SOI field effect transistor with a back gate for modulating a floating bodyIBM·Filed 2008·Granted Aug 10, 2010·25 cites·14 claims
- 1292US7676775B2Method to determine the root causes of failure patterns by using spatial correlation of tester dataIBM·Filed 2007·Granted Mar 9, 2010·30 cites·13 claims
- 1392US7402463B2Adopting feature of buried electrically conductive layer in dielectrics for electrical anti-fuse applicationIBM·Filed 2005·Granted Jul 22, 2008·21 cites·1 claims
- 1492US7348870B2Structure and method of fabricating a hinge type MEMS switchIBM·Filed 2005·Granted Mar 25, 2008·21 cites·13 claims
- 1589US7521760B2Integrated circuit chip with FETs having mixed body thickness and method of manufacture thereofIBM·Filed 2007·Granted Apr 21, 2009·11 cites·11 claims
- 1689US7223654B2MIM capacitor and method of fabricating sameIBM·Filed 2005·Granted May 29, 2007·16 cites·34 claims
- 1789US7105445B2Interconnect structures with encasing cap and methods of making thereofIBM·Filed 2005·Granted Sep 12, 2006·11 cites·24 claims
- 1888US7122898B1Electrical programmable metal resistorIBM·Filed 2005·Granted Oct 17, 2006·15 cites·11 claims
- 1986US7902061B2Interconnect structures with encasing cap and methods of making thereofIBM·Filed 2008·Granted Mar 8, 2011·7 cites·22 claims
- 2085US7728371B2SOI CMOS compatible multiplanar capacitorIBM·Filed 2007·Granted Jun 1, 2010·12 cites·13 claims
- 2184US8159042B2Adopting feature of buried electrically conductive layer in dielectrics for electrical anti-fuse applicationYANG CHIH-CHAO·Filed 2008·Granted Apr 17, 2012·9 cites·22 claims
- 2283US7947599B2Laser annealing for 3-D chip integrationIBM·Filed 2008·Granted May 24, 2011·7 cites·9 claims
- 2382US7968944B2Integrated circuit chip with FETs having mixed body thicknesses and method of manufacture thereofIBM·Filed 2009·Granted Jun 28, 2011·6 cites·16 claims
- 2482US7470929B2Fuse/anti-fuse structure and methods of making and programming sameIBM·Filed 2006·Granted Dec 30, 2008·9 cites·1 claims
- 2581US7282802B2Modified via bottom structure for reliability enhancementIBM·Filed 2004·Granted Oct 16, 2007·24 cites·19 claims
- 2680US8169077B2Dielectric interconnect structures and methods for forming the sameYANG CHIH-CHAO·Filed 2008·Granted May 1, 2012·6 cites·7 claims
- 2779US7911025B2Fuse/anti-fuse structure and methods of making and programming sameIBM·Filed 2008·Granted Mar 22, 2011·7 cites·9 claims
- 2879US7485567B2Microelectronic circuit structure with layered low dielectric constant regions and method of forming sameIBM·Filed 2007·Granted Feb 3, 2009·7 cites·17 claims
- 2979US7435674B2Dielectric interconnect structures and methods for forming the sameIBM·Filed 2006·Granted Oct 14, 2008·6 cites·6 claims
- 3078US7060546B2Ultra-thin SOI MOSFET method and structureIBM·Filed 2003·Granted Jun 13, 2006·25 cites·12 claims
- 3177US7439172B2Circuit structure with low dielectric constant regions and method of forming sameIBM·Filed 2007·Granted Oct 21, 2008·6 cites·19 claims
- 3274US9058887B2Reprogrammable electrical fuseHSU LOUIS C·Filed 2007·Granted Jun 16, 2015·6 cites·17 claims
- 3374US7821051B2MIM capacitor and method of fabricating sameIBM·Filed 2007·Granted Oct 26, 2010·5 cites·26 claims
- 3474US7660350B2High-speed multi-mode receiverIBM·Filed 2008·Granted Feb 9, 2010·5 cites·8 claims
- 3572US7285480B1Integrated circuit chip with FETs having mixed body thicknesses and method of manufacture thereofIBM·Filed 2006·Granted Oct 23, 2007·3 cites·12 claims
- 3671US7528065B2Structure and method for MOSFET gate electrode landing padIBM·Filed 2006·Granted May 5, 2009·4 cites·1 claims
- 3770US7233177B2Precision tuning of a phase-change resistive elementIBM·Filed 2005·Granted Jun 19, 2007·7 cites·35 claims
- 3868US7488677B2Interconnect structures with encasing cap and methods of making thereofIBM·Filed 2006·Granted Feb 10, 2009·2 cites·1 claims
- 3968US7232745B2Body capacitor for SOI memory descriptionIBM·Filed 2005·Granted Jun 19, 2007·3 cites·14 claims
- 4064US7692308B2Microelectronic circuit structure with layered low dielectric constant regionsIBM·Filed 2008·Granted Apr 6, 2010·2 cites·3 claims
- 4161US7927995B2Adopting feature of buried electrically conductive layer in dielectrics for electrical anti-fuse applicationIBM·Filed 2009·Granted Apr 19, 2011·1 cites·10 claims
- 4261US7906428B2Modified via bottom structure for reliability enhancementIBM·Filed 2008·Granted Mar 15, 2011·1 cites·11 claims
- 4359US7694243B2Avoiding device stressingIBM·Filed 2007·Granted Apr 6, 2010·3 cites·5 claims
- 4459US7378895B2On-chip electrically alterable resistorIBM·Filed 2004·Granted May 27, 2008·6 cites·11 claims
- 4558US8027416B2Structure for data communications systemsIBM·Filed 2008·Granted Sep 27, 2011·1 cites·6 claims
- 4656US7566599B2High performance FET with elevated source/drain regionIBM·Filed 2004·Granted Jul 28, 2009·5 cites·25 claims
- 4755US8105936B2Methods for forming dielectric interconnect structuresYANG CHIH-CHAO·Filed 2008·Granted Jan 31, 2012·0 cites·12 claims
- 4854US7790522B2Defect-free hybrid orientation technology for semiconductor devicesIBM·Filed 2009·Granted Sep 7, 2010·0 cites·9 claims
- 4953US8772941B2Circuit structure with low dielectric constant regionsCLEVENGER LAWRENCE A·Filed 2008·Granted Jul 8, 2014·0 cites·2 claims
- 5053US8189419B2Apparatus for nonvolatile multi-programmable electronic fuse systemCHEN HOWARD H·Filed 2009·Granted May 29, 2012·2 cites·21 claims
Showing the top 50 of 75 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →