Inventor · disambiguated record
Shigeyuki Nakazawa
Also filed as: NAKAZAWA SHIGEYUKI
13 granted patents·103 citations·filing 1998–2020
90Inventor score
Top patents by PatentIndex Score
13 records- 0193US11289135B1Precharge timing controlMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 29, 2022·4 cites·20 claims
- 0288US9466562B2Semiconductor chip having plural penetration electrode penetrating therethroughPS4 LUXCO SARL·Filed 2012·Granted Oct 11, 2016·10 cites·20 claims
- 0379US7151713B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2003·Granted Dec 19, 2006·20 cites·2 claims
- 0475US7414914B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2006·Granted Aug 19, 2008·7 cites·3 claims
- 0571US5894441ASemiconductor memory device with redundancy circuitNEC CORP·Filed 1998·Granted Apr 13, 1999·32 cites·15 claims
- 0666US6333888B1Semiconductor memory deviceNEC CORP·Filed 2000·Granted Dec 25, 2001·15 cites·8 claims
- 0765US7956470B2Semiconductor deviceELPIDA MEMORY INC·Filed 2006·Granted Jun 7, 2011·3 cites·14 claims
- 0865US7573778B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Aug 11, 2009·4 cites·3 claims
- 0953US6545922B2Semiconductor memory deviceNEC CORP·Filed 2000·Granted Apr 8, 2003·8 cites·11 claims
- 1043US8040751B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2009·Granted Oct 18, 2011·0 cites·6 claims
- 1141US7990789B2Semiconductor memory device and control methodELPIDA MEMORY INC·Filed 2009·Granted Aug 2, 2011·0 cites·10 claims
- 1235US7706166B2Semiconductor memory device comprising memory element programming circuits having different programming threshold power supply voltagesELPIDA MEMORY INC·Filed 2007·Granted Apr 27, 2010·0 cites·21 claims
- 1334US8525578B2Semiconductor device having plural optical fuses and manufacturing method thereofNAKAZAWA SHIGEYUKI·Filed 2012·Granted Sep 3, 2013·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →