Inventor · disambiguated record
Ronny Soetarman
Also filed as: SOETARMAN RONNY
29 granted patents·1 pending application·584 citations·filing 1994–2022
97Inventor score
Files withZETA INSTR INC10KLA TENCOR CORP6CANDELA INSTR4KLA TENCOR TECH CORP2SCHLUMBERGER TECHNOLOGIES INC2
Top patents by PatentIndex Score
30 records- 0196US5530372AMethod of probing a net of an IC at an optimal probe-pointSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Jun 25, 1996·140 cites·17 claims
- 0295US5675499AOptimal probe point placementSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Oct 7, 1997·130 cites·11 claims
- 0394US6031615ASystem and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughnessCANDELA INSTR·Filed 1998·Granted Feb 29, 2000·74 cites·93 claims
- 0492US11536940B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0591US7161669B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2006·Granted Jan 9, 2007·18 cites·26 claims
- 0690US10094787B2Multi-surface specular reflection inspectorZETA INSTR INC·Filed 2016·Granted Oct 9, 2018·4 cites·20 claims
- 0790US9921169B2Method of detecting defect location using multi-surface specular reflectionZETA INSTR INC·Filed 2016·Granted Mar 20, 2018·4 cites·16 claims
- 0888US6268919B1System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operationsCANDELA INSTR·Filed 1999·Granted Jul 31, 2001·47 cites·36 claims
- 0987US7397621B2Servo pattern characterization on magnetic disksKLA TENCOR TECH CORP·Filed 2006·Granted Jul 8, 2008·8 cites·17 claims
- 1086US7532318B2Wafer edge inspectionKLA TENCOR CORP·Filed 2006·Granted May 12, 2009·10 cites·29 claims
- 1186US6130749ASystem and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operationCANDELA INSTR·Filed 1999·Granted Oct 10, 2000·40 cites·29 claims
- 1282US10048480B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesXU JAMES JIANGUO·Filed 2011·Granted Aug 14, 2018·4 cites·9 claims
- 1382US7630086B2Surface finish roughness measurementKLA TENCOR CORP·Filed 2007·Granted Dec 8, 2009·17 cites·16 claims
- 1482US6229610B1System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operationCANDELA INSTR·Filed 1999·Granted May 8, 2001·33 cites·36 claims
- 1582US6198533B1High temperature thin film property measurement system and methodCANDELA INSTR INC·Filed 1999·Granted Mar 6, 2001·36 cites·111 claims
- 1681US10157457B2Optical measurement of opening dimensions in a waferZETA INSTR INC·Filed 2016·Granted Dec 18, 2018·4 cites·19 claims
- 1780US12265212B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2022·Granted Apr 1, 2025·0 cites·1 claims
- 1875US9036869B2Multi-surface optical 3D microscopeLEE KEN KINSUN·Filed 2011·Granted May 19, 2015·4 cites·19 claims
- 1974US9389408B23D microscope and methods of measuring patterned substratesHOU ZHEN·Filed 2011·Granted Jul 12, 2016·4 cites·28 claims
- 2072US11294161B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 2166US10168524B2Optical measurement of bump hieghtZETA INSTR INC·Filed 2016·Granted Jan 1, 2019·1 cites·22 claims
- 2263US10338009B2Method and apparatus to detect defects in transparent solidsZETA INSTR INC·Filed 2017·Granted Jul 2, 2019·0 cites·20 claims
- 2362US10884228B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2018·Granted Jan 5, 2021·0 cites·11 claims
- 2461US9784691B2Method and apparatus to optically detect defects in transparent solidsZETA INSTR INC·Filed 2014·Granted Oct 10, 2017·0 cites·13 claims
- 2556US7075741B1System and method for automatically determining magnetic eccentricity of a diskKLA TENCOR TECHNOLOGUES CORP·Filed 2004·Granted Jul 11, 2006·4 cites·10 claims
- 2649US10209501B23D microscope and methods of measuring patterned substratesZETA INSTR INC·Filed 2016·Granted Feb 19, 2019·0 cites·15 claims
- 2744US8976366B2System and method for monitoring LED chip surface roughening processXU JAMES JIANGUO·Filed 2012·Granted Mar 10, 2015·0 cites·42 claims
- 2842US10769769B2Dual mode inspectorZETA INSTR INC·Filed 2016·Granted Sep 8, 2020·0 cites·22 claims
- 2938US2018045937A1Automated 3-d measurementZETA INSTR INC·Filed 2016·Application pending·0 cites
- 3032US10359613B2Optical measurement of step size and plated metal thicknessZETA INSTR INC·Filed 2016·Granted Jul 23, 2019·0 cites·18 claims
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