Inventor · disambiguated record
James Jianguo Xu
Also filed as: XU JAMES · XU JAMES J · XU JAMES JIANGUO
34 granted patents·8 pending applications·415 citations·filing 1996–2025
96Inventor score
Top patents by PatentIndex Score
42 records- 0196US7729049B23-d optical microscopeZETA INSTR INC·Filed 2007·Granted Jun 1, 2010·37 cites·8 claims
- 0293US7944609B23-D optical microscopeZETA INSTR INC·Filed 2010·Granted May 17, 2011·14 cites·34 claims
- 0392US11536940B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0492US8174762B23-D optical microscopeXU JAMES JIANGUO·Filed 2010·Granted May 8, 2012·13 cites·12 claims
- 0591US7433031B2Defect review system with 2D scanning and a ring detectorCORE TECH OPTICAL INC·Filed 2004·Granted Oct 7, 2008·57 cites·6 claims
- 0688US6069690AIntegrated laser imaging and spectral analysis systemUNIPHASE CORP·Filed 1998·Granted May 30, 2000·102 cites·10 claims
- 0787US7110106B2Surface inspection systemCORETECH OPTICAL INC·Filed 2004·Granted Sep 19, 2006·43 cites·20 claims
- 0883US5912735ALaser/white light viewing laser imaging systemKLA TENCOR CORP·Filed 1997·Granted Jun 15, 1999·66 cites·10 claims
- 0982US10048480B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesXU JAMES JIANGUO·Filed 2011·Granted Aug 14, 2018·4 cites·9 claims
- 1081US10157457B2Optical measurement of opening dimensions in a waferZETA INSTR INC·Filed 2016·Granted Dec 18, 2018·4 cites·19 claims
- 1180US12265212B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2022·Granted Apr 1, 2025·0 cites·1 claims
- 1276US5761336AAperture optimization method providing improved defect detection and characterizationULTRAPOINTE CORP·Filed 1996·Granted Jun 2, 1998·46 cites·16 claims
- 1376US2025356189A1Accelerated model training from disparate and heterogeneous sources using a meta-databaseTRUIST BANK·Filed 2025·Application pending·0 cites
- 1475US9036869B2Multi-surface optical 3D microscopeLEE KEN KINSUN·Filed 2011·Granted May 19, 2015·4 cites·19 claims
- 1575US8184364B2Illuminator for a 3-D optical microscopeXU JAMES JIANGUO·Filed 2008·Granted May 22, 2012·7 cites·5 claims
- 1674US9389408B23D microscope and methods of measuring patterned substratesHOU ZHEN·Filed 2011·Granted Jul 12, 2016·4 cites·28 claims
- 1772US11294161B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 1870US2025259195A1Training machine learning model based on user actions and responsesTRUIST BANK·Filed 2025·Application pending·0 cites
- 1968US2025232326A1Automatically adjusting system activities based on trained machine learning modelTRUIST BANK·Filed 2025·Application pending·0 cites
- 2066US11914844B2Automated processing and dynamic filtering of content for displayTRUIST BANK·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 2166US10168524B2Optical measurement of bump hieghtZETA INSTR INC·Filed 2016·Granted Jan 1, 2019·1 cites·22 claims
- 2265US11966570B2Automated processing and dynamic filtering of content for displayTRUIST BANK·Filed 2022·Granted Apr 23, 2024·0 cites·20 claims
- 2365US11907500B2Automated processing and dynamic filtering of content for displayTRUIST BANK·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 2464US7043101B1Integrated optical pump moduleFINISAR CORP·Filed 2003·Granted May 9, 2006·11 cites·23 claims
- 2563US12406183B2Accelerated model training from disparate and heterogeneous sources using a meta-databaseTRUIST BANK·Filed 2022·Granted Sep 2, 2025·0 cites·20 claims
- 2663US12327261B2Training machine learning model based on user actions and responsesTRUIST BANK·Filed 2022·Granted Jun 10, 2025·0 cites·19 claims
- 2763US12307473B2Automatically adjusting system activities based on trained machine learning modelTRUIST BANK·Filed 2022·Granted May 20, 2025·0 cites·18 claims
- 2862US10884228B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2018·Granted Jan 5, 2021·0 cites·11 claims
- 2960US12243065B2Using machine learning model to automatically predict updated assessment scoreTRUIST BANK·Filed 2022·Granted Mar 4, 2025·0 cites·19 claims
- 3057US2025156890A1Using machine learning model to automatically predict updated assessment scoreTRUIST BANK·Filed 2025·Application pending·0 cites
- 3151US9664888B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 30, 2017·0 cites·20 claims
- 3251US2024037406A1Testing predicted data utilizing trained machine learning modelTRUIST BANK·Filed 2022·Application pending·0 cites
- 3350US9645381B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 9, 2017·0 cites·11 claims
- 3449US10209501B23D microscope and methods of measuring patterned substratesZETA INSTR INC·Filed 2016·Granted Feb 19, 2019·0 cites·15 claims
- 3549US2005105791A1Surface inspection methodFiled 2004·Application pending·0 cites
- 3647US2011202542A1Integration of voter and contributor data into political software and compliance systems for purposes of solicitation, compliance, vetting, and calls to actionARISTOTLE INTERNAT INC·Filed 2011·Application pending·0 cites
- 3745US11928128B2Construction of a meta-database from autonomously scanned disparate and heterogeneous sourcesTRUIST BANK·Filed 2022·Granted Mar 12, 2024·0 cites·20 claims
- 3845US11822564B1Graphical user interface enabling interactive visualizations using a meta-database constructed from autonomously scanned disparate and heterogeneous sourcesTRUIST BANK·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 3944US8976366B2System and method for monitoring LED chip surface roughening processXU JAMES JIANGUO·Filed 2012·Granted Mar 10, 2015·0 cites·42 claims
- 4042US10769769B2Dual mode inspectorZETA INSTR INC·Filed 2016·Granted Sep 8, 2020·0 cites·22 claims
- 4138US2018045937A1Automated 3-d measurementZETA INSTR INC·Filed 2016·Application pending·0 cites
- 4232US10359613B2Optical measurement of step size and plated metal thicknessZETA INSTR INC·Filed 2016·Granted Jul 23, 2019·0 cites·18 claims
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