Inventor · disambiguated record
Naoma Ban
Also filed as: BAN NAOMA
9 granted patents·1 pending application·28 citations·filing 2008–2020
82Inventor score
Top patents by PatentIndex Score
10 records- 0186US10832886B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 10, 2020·3 cites·11 claims
- 0285US11056310B2Charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 6, 2021·4 cites·10 claims
- 0385US8519334B2Scanning electron microscope and sample observation methodTAKADA SATOSHI·Filed 2011·Granted Aug 27, 2013·16 cites·11 claims
- 0476US9177757B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 3, 2015·3 cites·6 claims
- 0569US11239042B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·5 claims
- 0666US8013299B2Review method and review deviceHITACHI HIGH TECH CORP·Filed 2009·Granted Sep 6, 2011·1 cites·6 claims
- 0757US8878925B2Observation method and observation deviceBAN NAOMA·Filed 2010·Granted Nov 4, 2014·1 cites·18 claims
- 0849US2008263028A1Report Search Method, Report Search System, and Reviewing ApparatusHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 0942US8125647B2Charged particle beam apparatus and displacement detecting circuitTSUJI HIROSHI·Filed 2009·Granted Feb 28, 2012·0 cites·4 claims
- 1036US9136189B2Surface observation apparatus and surface observation methodHIRAI TAKEHIRO·Filed 2010·Granted Sep 15, 2015·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →