Inventor · disambiguated record
Koichi Terashima
Also filed as: TERASHIMA KOICHI
9 granted patents·11 pending applications·158 citations·filing 2003–2020
85Inventor score
Top patents by PatentIndex Score
20 records- 0196US7719043B2Semiconductor device with fin-type field effect transistor and manufacturing method thereof.NEC CORP·Filed 2005·Granted May 18, 2010·64 cites·22 claims
- 0295US7701018B2Semiconductor device and method for manufacturing sameNEC CORP·Filed 2005·Granted Apr 20, 2010·45 cites·34 claims
- 0385US7830703B2Semiconductor device and manufacturing method thereofNEC CORP·Filed 2005·Granted Nov 9, 2010·13 cites·35 claims
- 0485US7612416B2Semiconductor device having a conductive portion below an interlayer insulating film and method for producing the sameNEC CORP·Filed 2004·Granted Nov 3, 2009·36 cites·14 claims
- 0554US11870083B2Exterior body, abnormality detector, and abnormality detection systemNEC CORP·Filed 2019·Granted Jan 9, 2024·0 cites·10 claims
- 0651US11105376B2Bearing with measurement functionNEC CORP·Filed 2018·Granted Aug 31, 2021·0 cites·11 claims
- 0750US2021066567A1Magnetic alloy materialNEC CORP·Filed 2020·Application pending·0 cites
- 0849US11917917B2Thermoelectric conversion elementNEC CORP·Filed 2019·Granted Feb 27, 2024·0 cites·10 claims
- 0948US12041853B2Portable power supplyNEC CORP·Filed 2019·Granted Jul 16, 2024·0 cites·13 claims
- 1046US2021395865A1Magnetic alloy materialNEC CORP·Filed 2019·Application pending·0 cites
- 1140US11744469B2Thermal diffusion coefficient measuring device, and deep-body thermometer, deep-body temperature measuring device, and deep-body temperature measuring method using sameNEC CORP·Filed 2018·Granted Sep 5, 2023·0 cites·16 claims
- 1240US2020034367A1Relation search system, information processing device, method, and programNEC CORP·Filed 2018·Application pending·0 cites
- 1338US2007257277A1Semiconductor Device and Method for Manufacturing the SameNEC CORP·Filed 2005·Application pending·0 cites
- 1436US2020313062A1Thermoelectric conversion elementNEC CORP·Filed 2018·Application pending·0 cites
- 1536US2007187682A1Semiconductor device having fin-type effect transistorNEC CORP·Filed 2004·Application pending·0 cites
- 1636US2007075372A1Semiconductor device and manufacturing process thereforNEC CORP·Filed 2004·Application pending·0 cites
- 1735US2004051159A1Semiconductor device and semiconductor device manufacturing methodNEC CORP·Filed 2003·Application pending·0 cites
- 1834US2006130746A1Method for forming nickel silicide film, method for manufacturing semiconductor device, and method for etching nickel silicideTERASHIMA KOICHI·Filed 2004·Application pending·0 cites
- 1934US2020194651A1Thermoelectric conversion unit, power generation system, and thermoelectric conversion methodNEC CORP·Filed 2017·Application pending·0 cites
- 2032US2009014795A1Substrate for field effect transistor, field effect transistor and method for production thereofKOH RISHO·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →