Inventor · disambiguated record
Matthias Zieger
Also filed as: ZIEGER MATTHIAS
4 granted patents·15 citations·filing 2003–2014
68Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0168US7046025B2Test apparatus for testing substrates at low temperaturesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 16, 2006·13 cites·10 claims
- 0265US8841932B2Prober for testing devices in a repeat structure on a substrateWERNER FRANK-MICHAEL·Filed 2011·Granted Sep 23, 2014·2 cites·15 claims
- 0354US9983232B2Prober for testing devices in a repeat structure on a substrateCASCADE MICROTECH INC·Filed 2014·Granted May 29, 2018·0 cites·9 claims
- 0443US7932737B2Prober for testing devices in a repeat structure on a substrateCASCADE MICROTECH INC·Filed 2008·Granted Apr 26, 2011·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →