Inventor · disambiguated record
Fumihiro Takemura
Also filed as: TAKEMURA FUMIHIRO
11 granted patents·80 citations·filing 2002–2020
88Inventor score
Top patents by PatentIndex Score
11 records- 0187US8578284B2Hardness testing device with a user interface for setting test locationsTAKEMURA FUMIHIRO·Filed 2011·Granted Nov 5, 2013·10 cites·6 claims
- 0286US6671973B2Surface texture measuring instrument and a method of adjusting an attitude of a work for the sameMITUTOYO CORP·Filed 2002·Granted Jan 6, 2004·38 cites·13 claims
- 0380US8566735B2Hardness tester with a user interface for setting test locationsTAKEMURA FUMIHIRO·Filed 2011·Granted Oct 22, 2013·8 cites·6 claims
- 0479US9417171B2Hardness testerMITUTOYO CORP·Filed 2013·Granted Aug 16, 2016·3 cites·8 claims
- 0578US9442054B2Hardness tester having offset correction featureMITUTOYO CORP·Filed 2013·Granted Sep 13, 2016·3 cites·12 claims
- 0675US8650939B2Surface texture measuring machine and a surface texture measuring methodMATSUMIYA SADAYUKI·Filed 2010·Granted Feb 18, 2014·5 cites·4 claims
- 0772US7277818B2Method and program for leveling aspherical workpiecesMITUTOYO CORP·Filed 2006·Granted Oct 2, 2007·7 cites·11 claims
- 0858US7142313B2Interaxis angle correction methodMITUTOYO CORP·Filed 2006·Granted Nov 28, 2006·4 cites·3 claims
- 0955US8654351B2Offset amount calibrating method and surface profile measuring machineFUKUMOTO YASUSHI·Filed 2010·Granted Feb 18, 2014·2 cites·2 claims
- 1051US11221201B2Profile measuring machine and profile measuring methodMITUTOYO CORP·Filed 2020·Granted Jan 11, 2022·0 cites·8 claims
- 1133US7096149B2Method for determining coordinate system for device under measurement, and coordinate measuring apparatusMITUTOYO CORP·Filed 2005·Granted Aug 22, 2006·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →