Inventor · disambiguated record
Gijs Van Duinen
Also filed as: VAN DUINEN GIJS
4 granted patents·6 citations·filing 2013–2018
62Inventor score
Technology areasH01J
Files withFEI CO4
Top patents by PatentIndex Score
4 records- 0174US9136087B2Method of investigating and correcting aberrations in a charged-particle lens systemFEI CO·Filed 2013·Granted Sep 15, 2015·3 cites·19 claims
- 0271US9202670B2Method of investigating the wavefront of a charged-particle beamFEI CO·Filed 2014·Granted Dec 1, 2015·3 cites·19 claims
- 0341US10651007B2Cryogenic cell for mounting a specimen in a charged particle microscopeFEI CO·Filed 2018·Granted May 12, 2020·0 cites·7 claims
- 0434US9583303B2Aligning a featureless thin film in a TEMFEI CO·Filed 2015·Granted Feb 28, 2017·0 cites·20 claims
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