Inventor · disambiguated record
Jang Won Moon
Also filed as: MOON JANG-WON
8 granted patents·2 pending applications·24 citations·filing 2003–2013
82Inventor score
Top patents by PatentIndex Score
10 records- 0184US9146324B2Scintillator, method of fabricating the same and X-ray detector including the scintillatorSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Sep 29, 2015·2 cites·18 claims
- 0281US8822940B2X-ray detection panel and method of manufacturing the sameMOON JANG-WON·Filed 2012·Granted Sep 2, 2014·4 cites·26 claims
- 0370US9287309B2Isolation structure having a second impurity region with greater impurity doping concentration surrounds a first impurity region and method for forming the same, and image sensor including the isolation structure and method for fabricating the image sensorSK HYNIX INC·Filed 2013·Granted Mar 15, 2016·3 cites·20 claims
- 0466US7639547B2Semiconductor memory device for independently controlling internal supply voltages and method of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 29, 2009·6 cites·30 claims
- 0560US9456080B2Telephone system based on presence and call routing method thereofMOON JANG WON·Filed 2006·Granted Sep 27, 2016·3 cites·26 claims
- 0655US7554866B2Circuit and method of controlling input/output sense amplifier of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 30, 2009·3 cites·9 claims
- 0750US8737382B2Network operator brokering system and telephone system for providing optimal routing path for voice call using the same and providing method thereofMOON JANG WON·Filed 2006·Granted May 27, 2014·2 cites·18 claims
- 0847US8880665B2Nonstop service system using voting, and information updating and providing method in the sameMOON JANG WON·Filed 2006·Granted Nov 4, 2014·1 cites·20 claims
- 0942US2014353469A1Image sensor, semiconductor device and image sensor systemSK HYNIX INC·Filed 2013·Application pending·0 cites
- 1031US2004109366A1Variable-delay precharge circuits and methodsMOON JANG-WON·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →