Inventor · disambiguated record
Gigi Gambrell
Also filed as: GAMBRELL GIGI · GAMBRELL GIGI O · GAMBRELL GIGI OLIVE
7 granted patents·4 pending applications·191 citations·filing 1999–2007
86Inventor score
Top patents by PatentIndex Score
11 records- 0196US7015690B2Omnidirectional eddy current probe and inspection systemGEN ELECTRIC·Filed 2004·Granted Mar 21, 2006·127 cites·19 claims
- 0288US7233867B2Eddy current inspection method and systemGEN ELECTRIC·Filed 2005·Granted Jun 19, 2007·23 cites·25 claims
- 0387US7689030B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2005·Granted Mar 30, 2010·17 cites·17 claims
- 0465US7817845B2Multi-frequency image processing for inspecting parts having complex geometric shapesGEN ELECTRIC·Filed 2006·Granted Oct 19, 2010·7 cites·17 claims
- 0565US7436992B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Oct 14, 2008·6 cites·20 claims
- 0657US8013599B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Sep 6, 2011·2 cites·11 claims
- 0752US2007222439A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 0850US2006132123A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2004·Application pending·0 cites
- 0946US2011004452A1Method for compensation of responses from eddy current probesKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 1046US2010312494A1Process and apparatus for testing a component using an omni-directional eddy current probeKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 1141US6356069B1Eddy current calibration standardGEN ELECTRIC·Filed 1999·Granted Mar 12, 2002·9 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →