Inventor · disambiguated record
Hisashi Konaka
Also filed as: KONAKA HISASHI
5 granted patents·1 pending application·20 citations·filing 2010–2025
72Inventor score
Top patents by PatentIndex Score
6 records- 0191US12313573B2X-ray diffraction apparatus and measurement methodRIGAKU DENKI CO LTD·Filed 2023·Granted May 27, 2025·2 cites·12 claims
- 0288US8340248B2X-ray diffraction method and X-ray diffraction apparatusTORAYA HIDEO·Filed 2010·Granted Dec 25, 2012·16 cites·6 claims
- 0384US11788974B2Control apparatus, system, method, and programRIGAKU DENKI CO LTD·Filed 2020·Granted Oct 17, 2023·1 cites·12 claims
- 0475US10876979B2Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffractionRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·1 cites·6 claims
- 0572US2025277764A1X-ray diffraction apparatus and measurement methodRIGAKU DENKI CO LTD·Filed 2025·Application pending·0 cites
- 0647US10296725B2Structure refining apparatus, method and programRIGAKU DENKI CO LTD·Filed 2014·Granted May 21, 2019·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →