Inventor · disambiguated record
Ofer Yuli
Also filed as: YULI OFER
4 granted patents·1 citations·filing 2019–2020
57Inventor score
Top patents by PatentIndex Score
4 records- 0167US11189451B2Charged particle beam source and a method for assembling a charged particle beam sourceAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Nov 30, 2021·0 cites·20 claims
- 0267US11139142B2High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopyAPPLIED MATERIALS INC·Filed 2019·Granted Oct 5, 2021·1 cites·20 claims
- 0364US10886092B2Charged particle beam source and a method for assembling a charged particle beam sourceAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 5, 2021·0 cites·20 claims
- 0448US10943763B1Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beamAPPLIED MATERIALS INC·Filed 2019·Granted Mar 9, 2021·0 cites·20 claims
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