Inventor · disambiguated record
Hidenobu Matsumura
Also filed as: MATSUMURA HIDENOBU
6 granted patents·1 pending application·87 citations·filing 1998–2020
79Inventor score
Top patents by PatentIndex Score
7 records- 0174US6061283ASemiconductor integrated circuit evaluation systemADVANTEST CORP·Filed 1998·Granted May 9, 2000·37 cites·9 claims
- 0268US6370675B1Semiconductor integrated circuit design and evaluation system using cycle base timingADVANTEST CORP·Filed 1998·Granted Apr 9, 2002·32 cites·10 claims
- 0358US11635374B2Optical testing apparatusADVANTEST CORP·Filed 2020·Granted Apr 25, 2023·0 cites·9 claims
- 0446US6249891B1High speed test pattern evaluation apparatusADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·18 cites·9 claims
- 0537US9817024B2Test carrier for mounting and testing an electronic deviceADVANTEST CORP·Filed 2015·Granted Nov 14, 2017·0 cites·6 claims
- 0636US8604773B2Receiving apparatus, test apparatus, receiving method, and test methodKANTAKE SHUSUKE·Filed 2010·Granted Dec 10, 2013·0 cites·16 claims
- 0736US2006150019A1Semiconductor device, test apparatus and measurement method thereforADVANTEST CORP·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →