Inventor · disambiguated record
Satoru Oku
Also filed as: OKU SATORU
10 granted patents·182 citations·filing 1998–2011
89Inventor score
Top patents by PatentIndex Score
10 records- 0193US7579903B2Power-source potential control circuit and method of trimming power-source potentialNEC ELECTRONICS CORP·Filed 2006·Granted Aug 25, 2009·41 cites·17 claims
- 0288US6525595B2Booster, IC card having the same, and electronic equipment having the sameNEC CORP·Filed 2001·Granted Feb 25, 2003·67 cites·4 claims
- 0373US8091008B2Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory deviceOKU SATORU·Filed 2007·Granted Jan 3, 2012·8 cites·14 claims
- 0472US7990778B2Nonvolatile semiconductor memory and method for testing the sameRENESAS ELECTRONICS CORP·Filed 2009·Granted Aug 2, 2011·7 cites·10 claims
- 0564US6084387APower source circuit for generating positive and negative voltage sourcesNEC CORP·Filed 1999·Granted Jul 4, 2000·31 cites·6 claims
- 0647US6115288ASemiconductor memory deviceNEC CORP·Filed 1999·Granted Sep 5, 2000·11 cites·10 claims
- 0744US5942808ASemiconductor device with plural power supply circuits, plural internal circuits, and single external terminalNEC CORP·Filed 1998·Granted Aug 24, 1999·9 cites·12 claims
- 0841US6111792ANon-volatile semiconductor memory device for selective cell flash erasing/programmingNEC CORP·Filed 1999·Granted Aug 29, 2000·8 cites·8 claims
- 0940US8307262B2Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory deviceOKU SATORU·Filed 2011·Granted Nov 6, 2012·0 cites·14 claims
- 1038US8174909B2Nonvolatile semiconductor memory and method for testing the sameOKU SATORU·Filed 2011·Granted May 8, 2012·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →