Inventor · disambiguated record
Yuki Ojima
Also filed as: OJIMA YUKI
4 granted patents·2 pending applications·32 citations·filing 2004–2022
70Inventor score
Top patents by PatentIndex Score
6 records- 0184US8080790B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2009·Granted Dec 20, 2011·7 cites·20 claims
- 0284US6929892B2Method of monitoring an exposure processHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 16, 2005·25 cites·15 claims
- 0353US8487253B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2011·Granted Jul 16, 2013·0 cites·6 claims
- 0453US2023230886A1Processor system, semiconductor inspection system, and programHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0548US7723681B2Observation method with electron beamHITACHI HIGH TECH CORP·Filed 2007·Granted May 25, 2010·0 cites·9 claims
- 0641US2016140287A1Template Creation Device for Sample Observation Device, and Sample Observation DeviceHITACHI HIGH TECH CORP·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →